tag: IR drop

Managing P/P Tradeoffs With Voltage Droop Gets Trickier
By Ann Mutschler - 14 Sep, 2023 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to talk about voltage droop/IR drop with Bill Mullen, distinguished engineer at Ansys; Rajat Chaudhry, product management group director at Cadence; Heidi Barnes, senior applications engineer at Keysight Technologies; Venkatesh Santhanagopalan, product manager at Movellus; Joe Davis, senior director for Calibre interfaces and mPower EM/IR... » read more

Balancing IR Drop Unpredictability With Post-Silicon Flexibility
By Aakash Jani - 24 Aug, 2023 - Comments: 0

The concept of IR drop in silicon chips has always been a crucial aspect of chip design. However, recent technological trends and the emergence of new challenges, such as voltage-sensitive paths, have introduced a degree of uncertainty in predicting and effectively managing IR drop. These uncertainties are driving the need for a more flexible approach in mitigating on-die voltage droop. Increa... » read more

Mitigating Voltage Droop
By Aakash Jani - 13 Jun, 2023 - Comments: 0

Voltage droop, also known as IR drop, is a phenomenon that occurs when the current in the power delivery network abruptly changes due to workload fluctuations. This can lead to supply voltage drops across system-on-chips (SoCs) which can cause severe performance degradation, limit their energy efficiency, and in extreme cases can cause catastrophic timing failures. To avoid these issues, conven... » read more

Taming Corner Explosion In Complex Chips
By Brian Bailey - 23 Feb, 2023 - Comments: 0

There is a tenuous balance between the number of corners a design team must consider, the cost of analysis, and the margins they insert to deal with them, but that tradeoff is becoming a lot more difficult. If too many corners of a chip are explored, it might never see production. If not enough corners are explored, it could reduce yield. And if too much margin is added, the device may not be c... » read more

Minimizing EM/IR Impacts On IC Design Reliability And Performance
By Joel Mercier - 13 Sep, 2022 - Comments: 0

By Joel Mercier and Karen Chow As technologies and foundry process nodes continue to advance, it gets more difficult to design and verify integrated circuits (ICs). The challenges become even more apparent in 5nm and below nodes, and as the industry moves away from fin field-effect transistor (finFET) and into gate-all-around field-effect transistor (GAAFET) technologies. There are many prob... » read more

Beyond 5nm: Review of Buried Power Rails & Back-Side Power
By Technical Paper Link - 19 Aug, 2022 - Comments: 0

A new technical paper titled "A Holistic Evaluation of Buried Power Rails and Back-Side Power for Sub-5 nm Technology Nodes" is presented by researchers at UT Austin, Arm Research, and imec. Find the technical paper here. Published July 2022. S. S. T. Nibhanupudi et al., "A Holistic Evaluation of Buried Power Rails and Back-Side Power for Sub-5 nm Technology Nodes," in IEEE Transactions... » read more

Machine Learning for VLSI CAD: A Case Study in On-Chip Power Grid Design
By Technical Paper Link - 15 Apr, 2022 - Comments: 0

Abstract "With the improvement of VLSI technology, on-chip power grid design is becoming more challenging than before. In this design phase of VLSI CAD, power grids are generated in order to make power and ground connections to transistors or logic blocks. However, due to the scaling of supply voltage and increase in the number of transistors per unit area of the chip, power grid design has ... » read more

Overcoming The Growing Challenge Of Dynamic IR-Drop
By PV Srinivas - 24 Mar, 2022 - Comments: 0

IR-drop has always been somewhat of an issue in chip design; voltage decreases as current travels along any path with any resistance. Ohm’s Law is likely the first thing that every electrical engineer learns. But the challenges related to IR-drop (sometimes called voltage drop) have increased considerably in recent years, especially the dynamic IR-drop in the power/ground grid as circuits swi... » read more

Building Complex Chips That Last Longer
By Ed Sperling - 23 Sep, 2021 - Comments: 0

Semiconductor Engineering sat down to talk about design challenges in advanced packages and nodes with John Lee, vice president and general manager for semiconductors at Ansys; Shankar Krishnamoorthy, general manager of Synopsys' Design Group; Simon Burke, distinguished engineer at Xilinx; and Andrew Kahng, professor of CSE and ECE at UC San Diego. This discussion was held at the Ansys IDEAS co... » read more

Preventing Chips From Burning Up During Test
By Bryon Moyer - 09 Mar, 2021 - Comments: 1

It’s become increasingly difficult to manage the heat generated during IC test. Absent the proper mitigations, it’s easy to generate so much heat that probe cards and chips literally can burn up. As a result, implementing temperature-management techniques is becoming a critical part of IC testing. “We talk about systems, saying the system is good,” said Arun Krishnamoorthy, senior... » read more

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