tag: machine learning

Striking A Balance In Acoustic Inspection
By Ed Sperling - 12 Jun, 2023 - Comments: 0

Sound energy is a quick way to to spot voids, delamination, cracks, and other possible defects that are accessible from outside the chip or package, as well as some defects that are inside of chips. But acoustic inspection also is highly sensitive to different materials with different polarities, which can change the reflection of sound waves. Bill Zuckerman, product marketing manager at Nordso... » read more

Full Wafer OCD Metrology
By Nova - 06 Jun, 2023 - Comments: 0

Authored by: Daniel Doutt*a, Ping-ju Chena, Bhargava Ravooria, Tuyen K. Trana, Eitan Rothsteinb, Nir Kampelb, Lilach Tamamb, Effi Aboodyb, Avron Gerb, Harindra Vedalac ABSTRACT Optical Critical Dimension (OCD) spectroscopy is a reliable, non-destructive, and high-throughput measurement technique for metrology and process control that is widely used in semiconductor fabrication facilities (f... » read more

Welcome To EDA 4.0 And The AI-Driven Revolution
By Dan Yu - 01 Jun, 2023 - Comments: 1

By Dan Yu, Harry Foster, and Tom Fitzpatrick Welcome to the era of EDA 4.0, where we are witnessing a revolutionary transformation in electronic design automation driven by the power of artificial intelligence. The history of EDA can be delineated into distinct periods marked by significant technological advancements that have propelled faster design iterations, improved productivity, and fu... » read more

Security Becomes Much Bigger Issue For AI/ML Chips, Tools
By Lou Covey - 01 Jun, 2023 - Comments: 0

Security is becoming a bigger issue in AI and machine learning chips, in part because the chip industry is racing just to get new devices working, and in part because it's difficult to secure a new technology that is expected to adapt over time. And unlike in the past, when tools and methodologies were relatively fixed, nearly everything is in motion. Algorithms are being changed, EDA tools ... » read more

The Impact Of ML On Chip Design
By Ed Sperling - 22 May, 2023 - Comments: 0

Node scaling and rising complexity are increasing the time it takes to get chips out the door. At the same time, design teams are not getting larger. What is needed is a way to automate the creative process, and to not have to start every design from scratch. This is where reinforcement learning fits in, with its ability to centralize and store “tribal knowledge. Thomas Andersen, vice preside... » read more

Managing Water Supplies With Machine Learning
By Katherine Derbyshire - 18 May, 2023 - Comments: 0

From wet benches to cooling systems, fabs use vast amounts of water — millions of gallons per day at a typical foundry. In this era of climate change, though, water supplies are becoming less reliable and municipal water systems are becoming more restrictive. For example, local utilities might restrict a fab’s ability to draw from the public water supply, or might supply only treated wastew... » read more

GDDR6 Delivers The Performance For AI/ML Inference
By Frank Ferro - 15 May, 2023 - Comments: 0

AI/ML is evolving at a lightning pace. Not a week goes by right now without some new and exciting developments in the field, and applications like ChatGPT have brought generative AI capabilities firmly to the forefront of public attention. AI/ML is really two applications: training and inference. Each relies on memory performance, and each has a unique set of requirements that drive the choi... » read more

Making Tradeoffs With AI/ML/DL
By Ann Mutschler - 11 May, 2023 - Comments: 0

Machine learning, deep learning, and AI increasingly are being used in chip design, and they are being used to design chips that are optimized for ML/DL/AI. The challenge is understanding the tradeoffs on both sides, both of which are becoming increasingly complex and intertwined. On the design side, machine learning has been viewed as just another tool in the design team's toolbox. That's s... » read more

Pinpointing Timing Delays Can Improve Chip Reliability
By Anne Meixner - 09 May, 2023 - Comments: 0

Growing pressure to improve IC reliability in safety- and mission-critical applications is fueling demand for custom automated test pattern generation (ATPG) to detect small timing delays, and for chip telemetry circuits that can assess timing margin over a chip's lifetime. Knowing the timing margin in signal paths has become an essential component in that reliability. Timing relationships a... » read more

Data Analytics For The Chiplet Era
By Shinji Hioki - 09 May, 2023 - Comments: 0

This article is based on a paper presented at SEMICON Japan 2022. Moore’s Law has provided the semiconductor industry’s marching orders for device advancement over the past five decades. Chipmakers were successful in continually finding ways to shrink the transistor, which enabled fitting more circuits into a smaller space while keeping costs down. Today, however, Moore’s Law is slowin... » read more

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