tag: machine learning

Not All There: Heterogeneous Multiprocessor Design Tools
By Brian Bailey - 26 Jun, 2023 - Comments: 0

The design, implementation, and programming of multicore heterogeneous systems is becoming more common, often driven by the software workloads, but the tooling to help optimize the processors, interconnect, and memory are disjointed. Over the past few years, many tools have emerged that help with the definition and implementation of a single processor, optimized for a given set of software. ... » read more

Overcoming Regression Debug Challenges With Machine Learning
By Robert Ruiz - 22 Jun, 2023 - Comments: 0

Development of a modern semiconductor requires running many electronic design automation (EDA) tools many times over the course of the project. Every stage, from architectural exploration and design to final implementation and manufacturing preparation, has multiple methodology loops that must be repeated again and again. Even in such a complex development flow, functional simulation stands ... » read more

(Vision) Transformers: Rise Of The Chimera
By Jon Bunting - 20 Jun, 2023 - Comments: 0

It’s 2023 and transformers are having a moment. No, I’m not talking about the latest installment of the Transformers movie franchise, "Transformers: Rise of the Beasts"; I’m talking about the deep learning model architecture class, transformers, that is fueling anticipation, excitement, fear, and investment in AI. Transformers are not so new in the world of AI anymore; they were first ... » read more

193i Lithography Takes Center Stage…Again
By Gregory Haley - 15 Jun, 2023 - Comments: 0

Cutting-edge lithography to create smaller features increasingly is being supplemented by improvements in lithography for mature process nodes, both of which are required as SoCs and complex chips are decomposed and integrated into advanced packages. Until the 7nm era, the primary goal of leading-edge chipmakers was to pack everything onto a single system-on-chip (SoC) using the same process... » read more

Chiplets: Bridging The Gap Between The System Requirements And Design Aggregation, Planning, And Optimization
By Technical Paper Link - 14 Jun, 2023 - Comments: 0

A technical paper titled “System and Design Technology Co-optimization of Chiplet-based AI Accelerator with Machine Learning” was published by researchers at Auburn University. Abstract: "With the availability of advanced packaging technology and its attractive features, the chiplet-based architecture has gained traction among chip designers. The large design space and the lack of sys... » read more

CEO Outlook: Chiplets, Data Management, And Reliability
By Ed Sperling - 14 Jun, 2023 - Comments: 0

Semiconductor Engineering sat down to talk about changes in chip design with Joseph Sawicki, executive vice president for IC EDA at Siemens Digital Industries Software; John Kibarian, president and CEO of PDF Solutions; John Lee, general manager and vice president of Ansys' Semiconductor Business Unit; Niels Faché, vice president and general manager of PathWave Software Solutions at Keysight; ... » read more

Risks And Faults We Can Detect Using Machine Learning And Physics
By Tignis - 14 Jun, 2023 - Comments: 0

In its earliest form, technicians manually took condition status readings from individual pieces of equipment and used them to shape maintenance conclusions. Today, critical machine and system data can be streamed continuously, automatically, from industrial internet of things (IIoT) sensors for real-time analytics, diagnostics, and suggested actions. Click here to read more. » read more

Striking A Balance In Acoustic Inspection
By Ed Sperling - 12 Jun, 2023 - Comments: 0

Sound energy is a quick way to to spot voids, delamination, cracks, and other possible defects that are accessible from outside the chip or package, as well as some defects that are inside of chips. But acoustic inspection also is highly sensitive to different materials with different polarities, which can change the reflection of sound waves. Bill Zuckerman, product marketing manager at Nordso... » read more

Full Wafer OCD Metrology
By Nova - 06 Jun, 2023 - Comments: 0

Authored by: Daniel Doutt*a, Ping-ju Chena, Bhargava Ravooria, Tuyen K. Trana, Eitan Rothsteinb, Nir Kampelb, Lilach Tamamb, Effi Aboodyb, Avron Gerb, Harindra Vedalac ABSTRACT Optical Critical Dimension (OCD) spectroscopy is a reliable, non-destructive, and high-throughput measurement technique for metrology and process control that is widely used in semiconductor fabrication facilities (f... » read more

Welcome To EDA 4.0 And The AI-Driven Revolution
By Dan Yu - 01 Jun, 2023 - Comments: 1

By Dan Yu, Harry Foster, and Tom Fitzpatrick Welcome to the era of EDA 4.0, where we are witnessing a revolutionary transformation in electronic design automation driven by the power of artificial intelligence. The history of EDA can be delineated into distinct periods marked by significant technological advancements that have propelled faster design iterations, improved productivity, and fu... » read more

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