Preparing For Test Early In The Design Flow


Until very recently, semiconductor design, verification, and test were separate domains. Those domains have since begun to merge, driven by rising demand for reliability, shorter market windows, and increasingly complex chip architectures. In the past, products were designed from a functional perspective, and designers were not concerned about what the physical implementation of the product ... » read more

Blog Review: March 2


Arm's Charlotte Christopherson checks out SpiNNaker1, a project to develop a massively parallel, manycore supercomputer architecture that mimicked the interactions of biological neurons, and its follow up, SpiNNaker2, a hybrid system that combines statistical AI and neuromorphic computing. Cadence's Paul McLellan looks at open and generic PDKs that can be used by researchers and in education... » read more

Week In Review: Auto, Security, Pervasive Computing


Security Fraunhofer IIS received a grant to establish an R&D center for trustworthy integrated electronic systems for security and safety. Working with other Fraunhofer divisions, Fraunhofer IIS will use innovative methods in design and testing to help protect IP along the value chain of microelectronic components and systems. The center will focus on creating a secure design flow for inte... » read more

Data Center Architectures In Flux


Data center architectures are becoming increasingly customized and heterogeneous, shifting from processors made by a single vendor to a mix of processors and accelerators made by multiple vendors — including system companies' own design teams. Hyperscaler data centers have been migrating toward increasingly heterogeneous architectures for the past half decade or so, spurred by the rising c... » read more

Unintended Coupling Issues Grow


The number of indirect and often unexpected ways in which one design element may be affected by another is growing, making it more difficult to ensure a chip — or multiple chips in a package — will perform reliably. Long gone are the days when the only way that one part of a circuit could influence another was by an intended wire connecting them. As geometries get smaller, frequencies go... » read more

Dissolving The Barriers In Multi-Substrate 3D-IC Assembly Design


Advanced packaging continues to promise improved form factor, cost, performance, and functionality compared to the traditional transistor scaling on SoCs. This is done by integrating multiple dies on top of a substrate (organic or silicon). Besides multiple dies, multiple substrates can typically exist in a 3D-IC assembly. In this case, the benefits of advanced packaging are taken to a whole ne... » read more

Addressing Library Characterization And Verification Challenges Using ML


At advanced process nodes, Liberty or library (.lib) requirements are more demanding due to design complexities, increased number of corners required for timing signoff, and the need for statistical variation modeling. This results in an increase in size, complexity, and the number of .lib characterizations. Validation and verification of these complex and large .lib files is a challenging task... » read more

Blog Review: Feb. 23


Synopsys' Varun Agrawal looks at four new technologies have emerged to support the demands on 5G networks and applications, the challenges in validating all of those technologies together, and what's needed to perform end-to-end testing effectively for 5G O-RAN SoCs. Siemens EDA's Ray Salemi points to how FPGA retargeting could help address supply chain difficulties and some of the challenge... » read more

Week In Review: Auto, Security, Pervasive Computing


Automotive Renesas and AVL Software and Functions are collaborating to support developers of automotive ISO 26262-compliant electronic control units (ECUs). Renesas sells automotive R-Car SoCs, RH850 automotive control MCUs, PMICs, and software for levels ASIL B to ASIL D of ISO26262, but even with automotive ISO26262 parts, ECU system development process is never plug and play. Functional saf... » read more

Unsolved Issues In Next-Gen Photomasks


Experts at the Table: Semiconductor Engineering sat down to discuss optical and EUV photomasks issues, as well as the challenges facing the mask business, with Naoya Hayashi, research fellow at DNP; Peter Buck, director of MPC & mask defect management at Siemens Digital Industries Software; Bryan Kasprowicz, senior director of technical strategy at Hoya; and Aki Fujimura, CEO of D2S. What f... » read more

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