tag: Mentor

Blog Review: March 15
By Jesse Allen - 15 Mar, 2023 - Comments: 0

Siemens EDA's Dan Yu finds that high-quality, well-connected mass data are crucial to the success of applying machine learning to verification and recommends teams pivot to a data-centric workflow. Synopsys' Shankar Krishnamoorthy suggests that deploying AI-driven chip design and verification can free teams from iterative work, letting them focus instead on product differentiation and PPA en... » read more

Deep Learning (DL) Applications In Photomask To Wafer Semiconductor Manufacturing
By eBeam Initiative - 15 Mar, 2023 - Comments: 0

Published by the eBeam Initiative Member Companies (February 2023), this list of artificial intelligence (AI) systems used by member companies in their semiconductor manufacturing products shows progress. New examples of systems using AI include: image processing and parameter tuning in lithography tool mask metrology system B-SPline Control Point generation tool sem... » read more

Self-Heating Issues Spread
By Brian Bailey - 13 Mar, 2023 - Comments: 1

With every new node there are additional physical effects that must be considered, but not all of them are of the same level of criticality. One that is being mentioned more frequently is self-heating. All devices consume power and when they do that, it becomes heat. "In essence, all active devices generate heat as carriers move, creating channels for current to pass through the gates," says... » read more

Uneven Circuit Aging Becoming A Bigger Problem
By Ann Mutschler - 09 Mar, 2023 - Comments: 0

Circuit aging is emerging as a first-order design challenge as engineering teams look for new ways to improve reliability and ensure the functionality of chips throughout their expected lifetimes. The need for reliability is obvious in data centers and automobiles, where a chip failure could result in downtime or injury. It also is increasingly important in mobile and consumer electronics, w... » read more

Low-Power IC Design Without Compromise
By Janet Attar - 09 Mar, 2023 - Comments: 0

In the process of creating ICs, the digital implementation stage is focused on meeting the performance, power, and area (PPA) targets defined for the design. Traditionally, when talking about PPA metrics, “performance” has been the primary focus, with power and area recovered where possible, after meeting timing. But as designs have moved to smaller, more advanced process nodes, and as s... » read more

What Makes RISC-V Verification Unique?
By Brian Bailey - 09 Mar, 2023 - Comments: 0

Semiconductor Engineering sat down to discuss the verification of RISC-V processors with Pete Hardee, group director for product management at Cadence; Mike Eftimakis, vice president for strategy and ecosystem at Codasip; Simon Davidmann, founder and CEO of Imperas Software; Sven Beyer, program manager for processor verification at Siemens EDA; Kiran Vittal, senior director of alliances partner... » read more

A Hierarchical And Tractable Mixed-Signal Verification Methodology For First-Generation Analog AI Processors
By Siemens EDA - 08 Mar, 2023 - Comments: 0

Artificial intelligence (AI) is now the key driving force behind advances in information technology, big data and the internet of things (IoT). It is a technology that is developing at a rapid pace, particularly when it comes to the field of deep learning. Researchers are continually creating new variants of deep learning that expand the capabilities of machine learning. But building systems th... » read more

Blog Review: March 8
By Jesse Allen - 08 Mar, 2023 - Comments: 0

Synopsys' Rahul Thukral and Bhavana Chaurasia find that embedded MRAM is undergoing an uplift in utilization for low-power, advanced-node SoCs thanks to its high capacity, high density, and ability to scale to lower geometries. Siemens EDA's Chris Spear dives into the UVM Factory with a look at the  SystemVerilog Object-Oriented Programming concepts behind the factory. Cadence's Veena Pa... » read more

Test Challenges Mount As Demands For Reliability Increase
By Anne Meixner - 07 Mar, 2023 - Comments: 0

An emphasis of improving semiconductor quality is beginning to spread well beyond just data centers and automotive applications, where ICs play a role in mission- and safety-critical applications. But this focus on improved reliability is ratcheting up pressure throughout the test community, from lab to fab and into the field, in products where transistor density continues to grow — and wh... » read more

Standards: The Next Step For Silicon Photonics
By Karen Heyman - 07 Mar, 2023 - Comments: 0

Testing silicon photonics is becoming more critical and more complicated as the technology is used in new applications ranging from medicine to cryptography, lidar, and quantum computing, but how to do that in a way that is both consistent and predictable is still unresolved. For the past three decades, photonics largely has been an enabler for high-speed communications, a lucrative market t... » read more

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