tag: National Instruments

Week In Review: Manufacturing, Test
By Mark LaPedus - 12 Oct, 2018 - Comments: 0

Chipmakers GlobalFoundries has announced the addition of nine new partners to its RFwave Partner Program, including AkronIC, Ask Radio, Catena, University of Waterloo Centre for Intelligent Antenna and Radio Systems (CIARS), Giga Solution, Helic, Incize, Mentor Graphics and Xpeedic Technology. The RFwave Partner Program builds upon GF’s radio-frequency (RF) efforts. The new partners will pro... » read more

Week in Review: IoT, Security, Auto
By Jeff Dorsch - 12 Oct, 2018 - Comments: 0

Deals Dialog Semiconductor made a blockbuster deal with Apple – the chip company will license power management technologies and transfer some assets to Apple, which will use them in their internal chip research and development. More than 300 Dialog employees, mostly engineers, will join Apple, which will pay $300 million in cash for the transaction and prepay another $300 million for Dialog ... » read more

Blog Review: Oct. 10
By Jesse Allen - 10 Oct, 2018 - Comments: 0

In a video, Cadence's Megha Daga dives into sparsity in neural networks and how it affects bandwidth, performance, and power efficiency. In a video, Mentor's Colin Walls takes a look at efficient embedded code, and why that means different things at different times. Synopsys' Eric Huang argues that in the realm of video standards, HDMI, DisplayPort, and USB Type-C are set to continue comp... » read more

What is STS Software Bundle?
By NI - 08 Oct, 2018 - Comments: 0

The STS Software Bundle provides all the software tools and hardware drivers you need to efficiently develop and deploy test programs, interactively debug, and maintain and calibrate the NI Semiconductor Test System (STS). NI will release new bundles regularly to incorporate new functionality and hardware drivers. The STS Software Bundle includes tools for interactive measurements and debugg... » read more

Lab-To-Fab Testing
By Ed Sperling - 08 Oct, 2018 - Comments: 0

Test equipment vendors are working on integrating testing and simulation in the lab with testing done later in the fab, setting the stage for what potentially could be the most significant change in semiconductor test in years. If they are successful, this could greatly simplify design for test, which has become increasingly difficult as chips get more complex, denser, and as more heterogene... » read more

Automakers Take On More Responsibility
By Kevin Fogarty - 08 Oct, 2018 - Comments: 0

Chip and EDA companies are scrambling to deal with stiff safety regulations and harsh environmental conditions for automotive chips, but automakers are making big changes of their own to ensure all those components work together as expected. The result is a significant shift of responsibilities of companies in the automotive supply chain. Carmakers traditionally have left verification, valid... » read more

Auto Chip Design, Test Changes Ahead
By Kevin Fogarty - 19 Sep, 2018 - Comments: 0

The automotive industry’s unceasing demand for performance, coupled with larger and more complex processors, are driving broad changes in how electronics are designed, verified and tested. What's changing is that these systems, which include AI-oriented logic developed at the most advanced process nodes, need to last several times longer than traditional IT and consumer devices, and they n... » read more

Week in Review: IoT, Security, Auto
By Jeff Dorsch - 14 Sep, 2018 - Comments: 0

Internet of Things NXP Semiconductors provided its A71CH trust anchor to Google IoT Cloud, enabling authentication for Google IoT Cloud Core. The technology helps to secure edge devices for Internet of Things deployments. Separately, NXP announced the promotion of Kurt Sievers, executive vice president and general manager of the chip company’s automotive business, to president of NXP Semicon... » read more

The Race To Zero Defects
By Jeff Dorsch - 10 Sep, 2018 - Comments: 1

By Jeff Dorsch and Ed Sperling Testing chips is becoming more difficult, more time-consuming, and much more critical—particularly as these chips end up in cars, industrial automation, and a variety of edge devices. Now the question is how to provide enough test coverage to ensure that chips will work as expected without slowing down the manufacturing process or driving up costs. Balanci... » read more

Solutions For Engineering Curricula
By NI - 10 Sep, 2018 - Comments: 0

Topics in engineering courses vary widely from elementary to the sophisticated and integrating project-based learning into each can be a monumental undertaking involving months of research, emails, and meetings. Simplify your proposal by preparing with National Instrument's recommended solutions for each class, comparing the benefits of each recommendation to make a fully informed decision. ... » read more

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