tag: noise

Wrestling With Analog At 3nm
By Brian Bailey - 09 Sep, 2021 - Comments: 0

Analog engineers are facing big challenges at 3nm, forcing them to come up with creative solutions to a widening set of issues at each new process node. Still, these problems must be addressed, because no digital chip will work without at least some analog circuitry. As fabrication technologies shrink, digital logic improves in some combination of power, performance, and area. The process te... » read more

Using 5nm Chips And Advanced Packages In Cars
By Ed Sperling - 10 Mar, 2021 - Comments: 1

Semiconductor Engineering sat down to discuss the impact of advanced node chips and advanced packaging on automotive reliability with Jay Rathert, senior director of strategic collaborations at KLA; Dennis Ciplickas, vice president of advanced solutions at PDF Solutions; Uzi Baruch, vice president and general manager of the automotive business unit at OptimalPlus; Gal Carmel, general manager of... » read more

Power/Performance Bits: Jan. 5
By Jesse Allen - 05 Jan, 2021 - Comments: 0

Quiet qubits Researchers at the University of New South Wales Sydney recorded the lowest noise levels yet for a semiconductor qubit. Charge noise caused by material imperfections interferes with the information encoded on qubits, reducing accuracy. "The level of charge noise in semiconductor qubits has been a critical obstacle to achieving the accuracy levels we need for large-scale error-c... » read more

How Will Future Cars Interact With Humans?
By Bryon Moyer - 03 Dec, 2020 - Comments: 0

Future automobiles may come with a set of controls very different from what we’re used to now. Mechanical knobs and switches already are being replaced by touchscreens, but that's just the beginning. There are a multitude of other possible ways in which drivers can interact with their vehicles, and the list is growing as technology drives down the cost of this new human-machine interface (... » read more

High Throughput Noise Measurements
By Peter Andrews - 10 Nov, 2020 - Comments: 0

Flicker noise and random telegraph noise (RTN) testing can take a long time, especially when measuring down to frequencies of 1 Hz or below. Sweep times up to 30 min at a single temperature are common. And standard data collection for device models requires DUT data at multiple temperatures on small pads. To lower Cost of Test (CoT), and significantly increase on-wafer test throughput, a... » read more

112G SerDes Reliability
By Ed Sperling - 05 Oct, 2020 - Comments: 0

Priyank Shukla, product marketing manager at Synopsys, digs into 112Gbps SerDes, why it’s important to examine the performance of these devices in the context of a system, what is acceptable channel loss, and how density can affect performance, power and noise. » read more

Integrity Problems For Edge Devices
By Brian Bailey - 14 Sep, 2020 - Comments: 0

Battery-powered edge devices need to save every picojoule of energy they can, which often means running at very low voltages. This can create signal and power integrity issues normally seen at the very latest technology nodes. But because these tend to be lower-volume, lower-cost devices, developers often cannot afford to perform the same level of analysis on these devices. Noise can come in... » read more

Problems And Solutions In Analog Design
By Ann Mutschler - 05 Aug, 2020 - Comments: 1

Advanced chip design is becoming a great equalizer for analog and digital at each new node. Analog IP has more digital circuitry, and digital designs are more susceptible to kinds of noise and signal disruption that have plagued analog designs for years. This is making the design, test and packaging of SoCs much more complicated. Analog components cause the most chip production test failures... » read more

Challenges For Compute-In-Memory Accelerators
By Katherine Derbyshire - 18 Jun, 2020 - Comments: 1

A compute-in-memory (CIM) accelerator does not simply replace conventional logic. It's a lot more complicated than that. Regardless of the memory technology, the accelerator redefines the latency and energy consumption characteristics of the system as a whole. When the accelerator is built from noisy, low-precision computational elements, the situation becomes even more complex. Tzu-Hsian... » read more

Is Common Resistance Affecting Your Analog Design Reliability And Performance?
By Hossam Sarhan - 11 Jun, 2020 - Comments: 0

Integrated circuit (IC) design reliability has always been important and essential to market success. After all, if no one could count on your product to operate as designed, and for as long as intended, there wouldn’t be many buyers! However, given the increase in the types and complexity of design applications, coupled with the increasing technological challenge of manufacturing at advance... » read more

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