Shift Left Strategy For Semiconductor Production Testing


In the fast-paced world of semiconductor manufacturing, achieving higher yields and reducing costs are constant challenges. Ideally, yield should only be impacted by unavoidable defects when everything else is performing as expected. However, when yield reduction occurs due to the process sensitivity of the design, these issues can be detected and, in many cases, corrected. proteanTecs has d... » read more

Extending Chip Lifetime With Safer Voltage Scaling


What if your chips lived 20% longer without compromising performance, and even while reducing power consumption? How would it affect your product’s reliability and cost? What would be the effect on your profitability? With the demand for longer-lasting chips growing across industries, designers and reliability engineers face increasing pressure to ensure their products perform correctly fo... » read more

Advancements In Silicon Device Technology And Design Driving New SLM Monitor Categories


Silicon, the foundation of modern electronics, has seen continuous advancements since the early days of integrated circuits. The pace of innovation has been driven by the relentless quest for miniaturization, increased performance, and efficiency. However, Moore’s Law is no longer a given and silicon is facing functional limitations as technology scales. To address these challenges and conti... » read more

Reducing Design Margins With Silicon Model Calibration


By Guy Cortez and Mark Laird It’s no secret to anyone that chip design gets harder every year. There are two major trends driving these ever-increasing challenges. The first is the continual scaling down to smaller design nodes. Although the pace of new node introduction has slowed somewhat in recent years, the impact of each new geometry and process is more dramatic than ever before. Acce... » read more

Automotive Electronics Reliability Requires In-Field Silicon Monitoring


By Lorin Kennedy and Dan Alexandrescu For everyday consumers, no products require reliability more than automobiles. While consumers may be willing accept their laptops and phones limiting performance or abruptly turning off when systems reach unacceptable temperature levels, that is not the case for the reliability of Advanced Driver-Assistance Systems (ADAS) or other safety critical system... » read more

SLM Analytics Of In-Chip Monitor Data Unlock Greater Productivity And Cost Savings


When it comes to measuring key operational metrics such as power and performance of your silicon, in-chip monitors have been the longstanding cornerstone for providing such valuable measurements and insights. Data captured from these monitors – process monitors configured in the form of ring oscillator chains being the most common – can tell you if your chip is meeting the requisite power o... » read more

proteanTecs On-Chip Monitoring And Deep Data Analytics System


High reliability applications in service-critical markets, such as autonomous driving and cloud computing, demand maximum performance and minimal power and cost. Reducing design margins while maintaining high reliability becomes imperative. State-of-the-art silicon processes offer mainly logic density improvements at limited speedup. Worst-case design analysis is not cost effective anymore. ... » read more

Looking Inside Of Chips


Shai Cohen, co-founder and CEO of proteanTecs, sat down with Semiconductor Engineering to talk about how to boost reliability and add resiliency into chips and advanced packaging. What follows are excerpts of that conversation. SE: Several years ago, no one was thinking about on-chip monitoring. What's changed? Cohen: Today it is obvious that a solution is needed for optimizing performanc... » read more

Where And When End-to-End Analytics Works


With data exploding across all manufacturing steps, the promise of leveraging it from fab to field is beginning to pay off. Engineers are beginning to connect device data across manufacturing and test steps, making it possible to more easily achieve yield and quality goals at lower cost. The key is knowing which process knob will increase yield, which failures can be detected earlier, and wh... » read more

If These Chips Could Talk: Actionable Insights From Path Margin Monitors


One of the most important current trends in electronics is the gathering and analysis of big data to reap benefits in cost, power, performance, and reliability. This is becoming common in the chip development flow. For example, data harvested from simulation regressions can aid in debug and reaching coverage goals. Machine learning (ML) uses the results of many passes through implementation (lo... » read more

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