tag: reliability

IC Data Hot Potato: Who Owns And Manages It?
By Susan Rambo And Ed Sperling - 06 Jul, 2021 - Comments: 1

Modern inspection, metrology, and test equipment produces a flood of data during the manufacturing and testing of semiconductors. Now the question is what to do with all of that data. Image resolutions in inspection and metrology have been improving for some time to deal with increased density and smaller features, creating a downstream effect that has largely gone unmanaged. Higher resoluti... » read more

Qualifying Exposed Pad TQFP For AEC-Q006 Grade 0
By Yoshio Matsuda - 17 Jun, 2021 - Comments: 0

Semiconductor packages used in various vehicle applications require high reliability. As technological innovations in the automotive market increase, the demand for highly reliable packaging is increasing for applications in autonomous driving, human interfaces, electric vehicles (EVs), hybrid electric vehicles (HEVs) and more. Package reliability is essential because automotive packages must p... » read more

Targeting Redundancy In ICs
By Brian Bailey - 14 Jun, 2021 - Comments: 0

Technology developed for one purpose is often applicable to other areas, but organizational silos can get in the way of capitalizing on it until there is a clear cost advantage. Consider memory. All memories are fabricated with spare rows and columns that are swapped in when a device fails manufacturing test. "This is a common method to increase the yield of a device, based on how much memor... » read more

3 Technologies That Will Challenge Test
By Ed Sperling - 08 Jun, 2021 - Comments: 0

As chips are deployed in more complex systems and with new technologies, it's not clear exactly what chipmakers and systems vendors will be testing. The standard tests for voltage, temperature and electrical throughput still will be needed, of course. But that won't be sufficient to ensure that sensor fusion, machine learning, or millimeter wave 5/6G will be functioning properly. Each of tho... » read more

Reliability Costs Becoming Harder To Track
By Ed Sperling And Susan Rambo - 08 Jun, 2021 - Comments: 0

Ensuring reliability in chips is becoming more complex and significantly more expensive, shifting left into the design cycle and right into the field. But those costs also are becoming more difficult to define and track, varying greatly from one design to the next based upon process node, package technology, market segment, and which fab or OSAT is used. As the number of options increases fo... » read more

Recalculating The Cost Of Test
By Ed Sperling - 11 May, 2021 - Comments: 0

The cost of test is rising. For decades, test was limited to a flat 2% of the cost of designing and manufacturing a chip. Today, no one is quite sure what that cost really is, and there doesn't seem to be any single formula for determining it. In some cases, there isn't even a sense of urgency to finding out. Several significant changes are occurring that make any formula difficult to cal... » read more

Testing Analog Circuits Becoming More Difficult
By Susan Rambo - 11 May, 2021 - Comments: 1

Foundries and packaging houses are wrestling how to control heat in the testing phase, particularly as devices continue to shrink and as thermally sensitive analog circuits are added into SoCs and advanced packages to support everything from RF to AI. The overriding problem is that heat can damage chips or devices under test. That's certainly true for digital chips developed at advanced node... » read more

Chasing Test Escapes In IC Manufacturing
By Anne Meixner - 11 May, 2021 - Comments: 0

The number of bad chips that slip through testing and end up in the field can be significantly reduced before those devices ever leave the fab, but the cost of developing the necessary tests and analyzing the data has sharply limited adoption. Determining an acceptable test escape metric for an IC is essential to improving the yield-to-quality ratio in chip manufacturing, but what exactly is... » read more

Circuit Reliability Verification For Automotive Electronics
By Matthew Hogan - 06 May, 2021 - Comments: 0

By Matthew Hogan and Dina Medhat In the automotive industry, reliability and high quality are key attributes for electronic automotive systems and controls. Naturally, they are particularly crucial when developing functional safety (FuSa) solutions, where inadequate performance or product failure can lead to injury or death. When it comes to safety-related automotive electronics, ISO 26262 p... » read more

Steep Spike For Chip Complexity And Unknowns
By Ed Sperling - 05 May, 2021 - Comments: 0

Cramming more and different kinds of processors and memories onto a die or into a package is causing the number of unknowns and the complexity of those designs to skyrocket. There are good reasons for combining all of these different devices into an SoC or advanced package. They increase functionality and can offer big improvements in performance and power that are no longer available just b... » read more

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