tag: reliability

The Everything New Syndrome
By Ed Sperling - 12 Oct, 2021 - Comments: 0

Technology is all about the latest features, the fastest processing, with the lowest power. While that sounds great in marketing pitch, any or all of those factors don't necessarily equate to a better product or long-term user satisfaction. There's a reason semiconductor companies are conservative by nature. They want to know that when they spend tens or hundreds of millions of dollars on a ... » read more

Making Batteries Denser And Safer
By Ann Mutschler - 07 Oct, 2021 - Comments: 0

Battery technology is improving swiftly, driven by the rapidly rising demand for electric vehicles and the vast body of knowledge developed by the semiconductor industry. The market for electric vehicles (EVs) is on a fast upward trajectory, with global sales predicted to grow more than 12 times to more than 31 million vehicles. In fact, EVs will account for almost a third of new vehicle sal... » read more

The Importance Of Aging Simulation In IC Design
By Andre Lange - 09 Sep, 2021 - Comments: 0

Electronics reliability has been an important quality criterion in the automotive sector and in industrial automation for years. Electronics in this sector have to achieve product lifetimes of 10+ years under partially harsh environmental conditions. But the reliability of electronics is also becoming more important in other fields. For example, end customers now keep consumer products longer, ... » read more

Inner Spacer Engineering to Improve Mechanical Stability in Channel-Release Process of Nanosheet FETs
By Technical Paper Link - 28 Aug, 2021 - Comments: 0

  Abstract "Mechanical stress is demonstrated in the fabrication process of nanosheet FETs. In particular, unwanted mechanical instability stemming from gravity during channel-release is covered in detail by aid of 3-D simulations. The simulation results show the physical weakness of suspended nanosheets and the impact of nanosheet thickness. Inner spacer engineering based on geometr... » read more

Time To Rethink Memory Chip Design And Verification
By Anand Thiruvengadam - 12 Aug, 2021 - Comments: 1

It’s no secret to anyone that semiconductor development grows more challenging all the time. Each new process technology node packs more transistors into each die, creating more electrical issues and making heat dissipation harder. Floorplanning, logic synthesis, place and route, timing analysis, electrical analysis, and functional verification stretch electronic design automation (EDA) tools... » read more

Designing Chips In A ‘Lawless’ Industry
By Ed Sperling - 02 Aug, 2021 - Comments: 2

The guideposts for designing chips are disappearing or becoming less relevant. While engineers today have many more options for customizing a design, they have little direction about what works best for specific applications or what the return on investment will be for those efforts. For chip architects, this is proving to be an embarrassment of riches. However, that design freedom comes wit... » read more

MEMS: New Materials, Markets And Packaging
By Ed Sperling - 28 Jul, 2021 - Comments: 1

Semiconductor Engineering sat down to talk about future developments and challenges for microelectromechanical systems (MEMS) with Gerold Schropfer, director of MEMS products and European operations in Lam Research's Computational Products group, and Michelle Bourke, senior director of strategic marketing for Lam's Customer Support Business Group. What follows are excerpts of that conversation.... » read more

The Importance Of Product Burn-In Test
By Vineet Pancholi - 22 Jul, 2021 - Comments: 0

Product burn-in (BI) is an indispensable step in the production test flow to ensure good quality and a properly functioning product for the customer. Amkor takes pride in rating ‘quality delivered to the customer’ as one of the highest corporate virtues. See figure 1. Fig. 1: Defects per Million (DPM) and DPM goal reported over five years. Burned-in integrated circuits (ICs) have a ... » read more

Geo-Spatial Outlier Detection
By Anne Meixner - 19 Jul, 2021 - Comments: 0

Comparing die test results with other die on a wafer helps identify outliers, but combining that data with the exact location of an outlier offers a much deeper understanding of what can go wrong and why. The main idea in outlier detection is to find something in or on a die that is different from all the other dies on a wafer. Doing this in the context of a die’s neighbor has become easie... » read more

Automotive Innovations In Semiconductors
By Jeff Barnum - 15 Jul, 2021 - Comments: 0

By Jeff Barnum, Janay Camp, and Cathy Perry Sullivan The semiconductor industry performed better than expected in 2020 despite the impact of COVID-19 on the global economy and is preparing for accelerated growth in 2021 and beyond. The global coronavirus pandemic significantly increased demand for communications electronics and fueled the growth in cloud computing to support remote work and ... » read more

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