Week In Review: Design, Low Power


Nvidia acquired Oski Technology. Oski provides formal verification methodologies and consulting services, and Nvidia said that the acquisition will allow it to increase its investment in formal verification strategies. Oski's Gurugram, India, design center will become Nvidia's fourth engineering office in the country. Based in San Jose, Calif., it was founded in 2005. Terms of the deal were not... » read more

Week In Review: Auto, Security, Pervasive Computing


Automotive Qualcomm and SSW Partners, an investment partnership, now have a definitive agreement to acquire advanced driver assistance systems (ADAS) company Veoneer for $37.00 per share in an all-cash transaction that equals $4.5 billion in equity value. A few months ago, Qualcomm made the proposal to Veoneer after the company already had an agreement in place with Magma, a 60-year-old automo... » read more

Making Batteries Denser And Safer


Battery technology is improving swiftly, driven by the rapidly rising demand for electric vehicles and the vast body of knowledge developed by the semiconductor industry. The market for electric vehicles (EVs) is on a fast upward trajectory, with global sales predicted to grow more than 12 times to more than 31 million vehicles. In fact, EVs will account for almost a third of new vehicle sal... » read more

Week In Review: Design, Low Power


Valens Semiconductor began trading on the New York Stock Exchange as VLN after a merger with special-purpose acquisition company (SPAC) PTK Acquisition Corp. Valens offers high-speed connectivity chips for the audio-video and automotive markets, including its HDBaseT technology for connectivity between ultra-HD video sources and remote displays and its in-vehicle high-speed links. The transacti... » read more

Week In Review: Auto, Security, Pervasive Computing


Automotive Arm announced a new software architecture, two reference hardware implementations, and its role leading a new industry group that will work on open-source software for automotive use. The Scalable Open Architecture for Embedded Edge (SOAFEE) is based on Arm’s Project Cassini and SystemReady, aims to help the automotive industry move to software-defined systems by tackling the comp... » read more

Long-Haul Trucking With Fewer Drivers


The trucking industry is betting heavily on increasing levels of autonomy and electrification to reduce the cost of moving goods and to overcome persistent problems. The economics of autonomous driving are compelling, not least of which is an almost perpetual shortage of qualified drivers. But there also are a number of technical hurdles to making this work. On top of the challenges facing t... » read more

Convolutional Compaction-Based MRAM Fault Diagnosis


Abstract: "Spin-transfer torque magnetoresistive random-access memories (STT-MRAMs) are gradually superseding conventional SRAMs as last-level cache in System-on-Chip designs. Their manufacturing process includes trimming a reference resistance in STT-MRAM modules to reliably determine the logic values of 0 and 1 during read operations. Typically, an on-chip trimming routine consists of mult... » read more

MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM


Abstract: "Spin Transfer Torque Magnetic Random Access Memory (STT-MRAM) is one of the most promising candidates to replace conventional embedded memory such as Static RAM and Dynamic RAM. However, due to the small on/off ratio of MRAM cells, process variations may reduce the operating margin of a chip. Reference trimming was suggested as one of the ways to reduce variation impact to the chi... » read more

Designing Chips For Test Data


Collecting data to determine the health of a chip throughout its lifecycle is becoming necessary as chips are used in more critical applications, but being able to access that data isn't always so simple. It requires moving signals through a complex, sometimes unpredictable, and often hostile environment, which is a daunting challenge under the best of conditions. There is a growing sense of... » read more

Design For Test Data


As design pushes deeper into data-driven architectures, so does test. Geir Eide, director for product management of DFT and Tessent Silicon Lifecycle Solutions at Siemens Digital Industries Software, talks with Semiconductor Engineering about a subtle but significant shift for designing testability into chips so that test data can be used at multiple stages during a device’s lifetime. » read more

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