Robust Dynamic Voltage Droop Mitigation And Power Management


Power management is one of the keys for developing successful semiconductors products. There are virtually no applications for which power consumption is not a concern. Many creative solutions have been developed to reduce and manage power. Making these schemes work robustly in real-world conditions can be a challenge. This post considers widely used methods—voltage droop/glitch detection and... » read more

Harnessing Silicon Lifecycle Management For Chip Security


Silicon lifecycle management is starting to be used in ways that extend well beyond its original mission of ensuring a chip functions to spec throughout its expected lifetime. While tracking aging effects and component failures are still important, the technology also is being deployed to proactively monitor, authenticate, and respond to potential threats in real-time. In fact, not applying ... » read more

The Real-World Impact Of Silicon Lifecycle Management On Chip Architectures


Silicon lifecycle management (SLM) is transforming chip architectures, empowering designers to build smarter, more resilient, and secure semiconductor devices by leveraging data from manufacturing to end of life in the field. That data can be used to improve future designs, reduce margin, and continuously optimize performance and power efficiency throughout a chip's lifetime. Moreover, under... » read more

Keeping The Lights On: How Digital Twins And Smart Semiconductor Management Power Our 24/7 World


Hey there, tech enthusiasts and digital pioneers! Have you ever stopped to think about the tiny, intricate components that keep our modern world humming? From the advanced safety features in your car to the massive data centers powering AI, semiconductors are truly the unsung heroes. But what happens when these tiny titans face immense pressure, like the non-stop demands of AI workloads? That's... » read more

Designing for Reliability, Availability, and Serviceability Across the System Lifecycle


Discover how embedding advanced monitoring and analytics directly into silicon is redefining system management across the entire lifecycle. This white paper examines the evolving role of reliability, availability, and serviceability (RAS) in modern electronic systems, highlighting why proactive resilience has become just as critical as raw performance. It explores strategies for reducing costly... » read more

Expanding The Scope Of Testing In Complex Systems


Semiconductor devices now anchor the world’s most demanding infrastructures—from hyperscale data centers to advanced automotive platforms and industrial control systems. At scale, even rare faults can have significant cumulative impact, and the downstream consequences of failure extend far beyond a single board or rack. Unplanned outages translate into lost revenue, contractual penalties, f... » read more

Silicon Lifecycle Management


How chips are used is changing, and so are the requirements. In the past, markets were largely segmented by application, which determined how chips were designed. High-performance processors went into notebook computers, low-power chipsets were deployed in mobile devices, and complex SoCs and advanced packages were used in data centers. But with the spread of AI everywhere, traditional segmenta... » read more

Monitor, Test, And Repair For Multi-Die Health And Reliability


Ever since the earliest semiconductor devices, silicon health has been a concern. Systems manufacturers wanted to be sure that their chips worked properly before being soldered onto printed circuit boards (PCBs). They put pressure on semiconductor suppliers to test wafers, individual dies, and assembled parts before they were shipped. A wide range of design-for-test (DFT) approaches were develo... » read more

Silicon Lifecycle Management Gains Traction, But It’s Complicated


Silicon lifecycle management (SLM) is gaining ground in semiconductor design and test by leveraging specialized on-die sensors and analytics engines to improve power, performance, yield, and reliability. Most modern SoCs mitigate the guesswork by leveraging DFT, which includes adding memory built-in self-test (BiST) or improving functional coverage, but these tests were meant for verifying c... » read more

SLM: Actionable Silicon Insights Through Intelligent Measurement and Analysis


Developing semiconductors has always been a complex process, with advancements in electronic design automation (EDA) tools and fabrication technologies working to meet growing demands for larger designs, improved power efficiency, and better performance. As chip and system complexity increases alongside higher expectations for product reliability and longevity, traditional methods are reaching ... » read more

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