tag: stacked die

Experts At The Table: Challenges At 20nm
By Ed Sperling - 23 Aug, 2013 - Comments: 0

By Ed Sperling Low-Power/High-Performance Engineering sat down to discuss the challenges at 20nm and beyond with Jean-Pierre Geronimi, special projects director at STMicroelectronics; Pete McCrorie, director of product marketing for silicon realization at Cadence; Carey Robertson, director of product marketing at Mentor Graphics; and Isadore Katz, president and CEO of CLK Design Automation. Wh... » read more

Stacking The Deck
By Javier DeLaCruz - 22 Aug, 2013 - Comments: 0

By Javier DeLaCruz The pinnacle of system-on-chip has passed. There are several dynamics that are moving the industry away from the SoC philosophy that was so popular just a few short years ago. One of the significant factors is that the cost per gate for CMOS nodes below 28nm is rising for the first time in the history of our industry. Another critical factor is the emergence of through-silic... » read more

Memory Architectures Undergo Changes
By Ed Sperling - 22 Aug, 2013 - Comments: 0

By Ed Sperling Memory architectures are taking some new twists. Fueled by multi-core and multiple processors, as well as some speed bumps using existing technology, SoC makers are beginning to rethink how to architect, model and assemble memory to improve speed, lower power and reduce cost. What’s unusual about all of this is that it doesn’t rely on new technology, although there certai... » read more

Stacking The Deck
By Javier DeLaCruz - 22 Aug, 2013 - Comments: 0

By Javier DeLaCruz The pinnacle of system-on-chip has passed. There are several dynamics that are moving the industry away from the SoC philosophy that was so popular just a few short years ago. One of the significant factors is that the cost per gate for CMOS nodes below 28nm is rising for the first time in the history of our industry. Another critical factor is the emergence of through-silic... » read more

ATE Market Changes With The Times
By Jeff Chappell - 15 Aug, 2013 - Comments: 0

By Jeff Chappell A declining PC market in recent years coupled with the continuing growth of mobile phones and tablets has meant changes throughout the semiconductor supply chain, and automated test equipment is no exception. For example, a decade ago memory test—namely DRAM—was a large market compared with that of nascent system-on-a-chip (SoC) testing. In fact, at the time some test e... » read more

Materials, Software And Techniques
By Ed Sperling - 26 Jul, 2013 - Comments: 0

The future of advanced semiconductor technology is about to split evenly into three different areas. On the leading edge of manufacturing, Applied Materials CEO Mike Splinter called it correctly—it’s all about materials. Just shrinking features isn’t buying much anymore. In fact, at advanced nodes, with extra margin built into designs, it frequently doesn’t buy anything except extra ... » read more

The New ASIC
By Javier DeLaCruz - 25 Jul, 2013 - Comments: 0

By Javier DeLaCruz The current state of the art For years, large ASICs like the ones used in network processing, supercomputing and high-end personal computing have had very interesting similarities. The figure below is a fairly typical floorplan of such an ASIC. After taping out over a dozen of these types of chips a year, it is interesting to see that the interfaces have changed, processo... » read more

3D IC Supply Chain: Still Under Construction
By Barbara Jorgensen - 25 Jul, 2013 - Comments: 1

By Barbara Jorgensen and Ed Sperling Stacked die, which promise high levels of integration, a tiny footprint, energy conservation and blinding speed, still have some big hurdles to overcome. Cost, packaging and manufacturability continue to make steady progress, with test chips being produced by all of the major foundries. But in a disaggregated ecosystem, the supply chain remains a big st... » read more

Experts At The Table: Who Pays For Low Power?
By Ed Sperling - 19 Jul, 2013 - Comments: 0

By Ed Sperling Low-Power/High-Performance Engineering sat down to discuss the cost of low power with Fadi Gebara, research staff member for IBM’s Austin Research Lab; David Pan, associate professor in the department of electrical and computer engineering at the University of Texas; Aveek Sarkar, vice president of product engineering and support at Apache Design; and Tim Whitfield, director o... » read more

Changes And Challenges
By Ed Sperling - 18 Jul, 2013 - Comments: 0

At 130nm, the shift to copper interconnects and 300mm wafer sizes was considered to be the most difficult transition in its long and incredibly efficient history. The next chapter will be even tougher. It’s not that change is a foreign concept to semiconductor design and manufacturing. In fact, it’s probably the only constant over the past 50 years. But in the past, those changes tended ... » read more

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