tag: test

True Zero Trust Combats IC Manufacturing Security Challenges
By Michael Chang - 08 Feb, 2024 - Comments: 0

The semiconductor manufacturing industry is facing a host of unprecedented technology and security challenges. A common catchphrase these days is that “data is the new oil.” Data is everywhere, in everything we do, and there is both good and bad associated with this trend. Data everywhere creates new security issues that need to be addressed to protect the integrity of your information and ... » read more

AI-Driven Test Optimization Solves Semiconductor Test Costs And Design Schedules
By Sri Ganta - 08 Feb, 2024 - Comments: 0

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis, and corresponding decision making that are otherwise limited by human abilities. Therefore, complex challenges in semiconductor design, test and manufacturing are a perfect match for AI. The... » read more

Partnership To Improve Semiconductor Quality And Yield
By Eli Roth - 08 Feb, 2024 - Comments: 0

By Eran Rousseau (NI) and Eli Roth (Teradyne) The semiconductor industry is notorious for its high production costs and the critical importance of maintaining impeccable product quality. As technology advances and consumer expectations rise, semiconductor companies face constant pressure to meet these cost and quality goals while also delivering cutting-edge products. Traditionally, the s... » read more

Wireless Trend Predictions For 2024 And Their Impact On The Test And Measurement Industry
By Niklas Nolemo - 09 Jan, 2024 - Comments: 0

The ever-evolving landscape of wireless technology continues to shape how we connect, communicate, and innovate. Connected systems continue to grow in complexity and reliance on one another which will impact the test & measurement industry significantly.  As we step into the year 2024, several key wireless trends are set to dominate the industry, ushering in a new era of connectivity and r... » read more

Meeting The Test Challenges Of Ultra-Wideband Chipsets
By Kevin Yan - 09 Jan, 2024 - Comments: 0

By Kevin Yan and Daniel Sun This article is adapted from a paper and presentation at SEMICON China, March 2023. Ultra-wideband (UWB) technology, as defined by IEEE 802.15.4 and 802.15.4z standards, enables short-range, low-power RF location-based services and wireless communication. A variety of devices have reached the market to help implement UWB capability, but these devices present si... » read more

Unraveling PCIe 6.0 Loopback And Digital Near-End Loopback Feature
By Sabnam Sahoo - 21 Dec, 2023 - Comments: 0

The PCIe specification has given a specific Link Training and Status State Machine (LTSSM) state named Loopback, which is intended for test and fault isolation use. Basically, it gives a mechanism that involves looping back the data that was received in the Loopback LTSSM state. The entry and exit behavior are specified, and all other details are implementation-specific. Loopback can op... » read more

Testing ICs Faster, Sooner, And Better
By Laura Peters - 12 Dec, 2023 - Comments: 0

The infrastructure around semiconductor testing is changing as companies build systems capable of managing big data, utilizing real-time data streams and analysis to reduce escape rates on complex IC devices. At the heart of these tooling and operational changes is the need to solve infant mortality issues faster, and to catch latent failures before they become reliability problems in the fi... » read more

Closing The Test And Metrology Gap In 3D-IC Packages
By Gregory Haley - 12 Dec, 2023 - Comments: 0

The industry is investing in more precise and productive inspection and testing to enable advanced packages and eventually, 3D ICs. The next generations of aerospace, automotive, smartphone, and wearable tech most likely will be powered by multiple layers of intricately connected silicon, a stark departure from the planar landscapes of traditional integrated circuits. These 3D-ICs, compos... » read more

Unleashing The Power Of Test Through Data
By James Guilmart - 12 Dec, 2023 - Comments: 0

In the relentless pursuit of technological innovation, test engineers find themselves facing ever-increasing pressures to deliver flawless products at an unprecedented pace. From the rapid evolution of autonomous vehicles to the advent of 5G and beyond, the demands on engineering teams continue escalating. While organizations strive to optimize their testing processes, the need for efficient te... » read more

Deploying Cutting-Edge Adaptive Test Analytics Apps
By Ken Butler - 12 Dec, 2023 - Comments: 0

By Ken Butler, Advantest, and Guy Cortez, Synopsys Semiconductor test challenges abound in this era of AI. As such, semiconductor test engineering is increasingly moving towards fully adaptive test where each device receives the “right” test content to assess its correctness. Advantest and Synopsys have partnered to provide new cutting-edge real-time adaptive test applications at the te... » read more

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