tag: test

Boosting Production Performance: Ensuring Only Known-Good Sockets Enter Your Line
By Jesse Ko - 09 Dec, 2025 - Comments: 0

Efficient, stable, and high-yield semiconductor production depends on one often-overlooked factor: the health of your test sockets. In many factories, socket maintenance and inspection practices haven't kept pace with the demands of today’s high-density, high-speed packages. The result? Hidden marginal pins, unexpected downtime, multisite yield variation, and inflated manufacturing costs. ... » read more

Beyond The Core: Tackling System-Wide Debugging For Complex SoCs
By Francisca Tan - 09 Dec, 2025 - Comments: 0

The world of System-on-Chips (SoCs) is evolving – with the advancement of generative AI, the increasing demand for high-performance compute, and the innovative shift towards multi-chiplet architectures, system complexity is advancing at an increased pace. And with complexity comes an even greater challenge: debugging complexity. Silent data corruption, elusive timing-sensitive bugs, and i... » read more

Tackling Chip Complexity With Integrated System-Level Test Solutions
By Davette Berry - 09 Dec, 2025 - Comments: 0

As the sophistication of semiconductors continues to grow, so does the need for system-level test (SLT) in production to ensure that high-performance processors, chiplets, and other advanced devices function as expected in real-world environments. Once seen primarily as a fallback to catch what traditional automated test equipment (ATE) missed, SLT has now become a mission-critical step for val... » read more

Beyond The Bottleneck: 3 Breakthroughs In High-Throughput Connector Testing
By Reagan Oliver - 11 Nov, 2025 - Comments: 0

By Reagan Oliver and Jesse Ko Ensuring the quality of mass-produced electronic connectors without creating a production bottleneck remains a persistent challenge in manufacturing. As demand for speed and reliability increases, innovative testing solutions are emerging to meet this need head-on. This article breaks down three key breakthroughs in modern connector testing technology based on a... » read more

AI Memory: Enabling The Next Era Of High-Performance Computing
By Tadashi Oda - 11 Nov, 2025 - Comments: 0

The rapid advancement of artificial intelligence (AI) is driving unprecedented demand for high-performance memory solutions. AI-driven applications are fueling significant year-over-year growth in high-bandwidth memory (HBM). However, as AI models grow in complexity—from large language models (LLMs) to real-time inference applications—the need for faster, higher-bandwidth, and energy-effici... » read more

Solving Today’s Toughest Test Challenges: A New Era Of Engineering Productivity
By Ed Seng - 11 Nov, 2025 - Comments: 0

Today’s test engineers face unprecedented demands as semiconductor designs grow more complex and product cycles accelerate. Advanced packaging, chiplet architectures, and AI accelerators are reshaping the landscape, yet engineering resources remain fixed. Traditional approaches to scaling productivity by adding headcount no longer apply. While cost of test is always a consideration, ensuri... » read more

Integrating Design Verification To Approach Zero Defects
By Jyothy Jaganathan - 06 Nov, 2025 - Comments: 0

As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing test coverage—often exceeding 99%. Yet, meeting stringent zero-defect defective parts per million (DPPM) targets remains a formidable challenge. Traditional structural testing methods frequently ... » read more

Expanding The Scope Of Testing In Complex Systems
By Nozar Nozarian - 14 Oct, 2025 - Comments: 0

Semiconductor devices now anchor the world’s most demanding infrastructures—from hyperscale data centers to advanced automotive platforms and industrial control systems. At scale, even rare faults can have significant cumulative impact, and the downstream consequences of failure extend far beyond a single board or rack. Unplanned outages translate into lost revenue, contractual penalties, f... » read more

Enhancing Test Socket Performance Through Application-Specific Validation And System-Level Per-Pin OQC
By Jesse Ko - 14 Oct, 2025 - Comments: 0

As semiconductor devices continue to advance, the demand for reliable, high-performance test sockets has never been greater. Yet, traditional socket design validation methods—such as per-pin characterization and generic housing evaluations—often fall short of reflecting true application specific system-level performance. This gap between lab measurements and real-world application not only ... » read more

Revolutionizing Chip Testing: Navigating Bottlenecks
By Vidya Neerkundar - 14 Oct, 2025 - Comments: 0

In today's rapidly evolving semiconductor landscape, System-on-Chips (SoCs) are becoming increasingly complex, integrating multiple processing cores, specialized accelerators and vast memory arrays. This escalating complexity, while enabling incredible functionality, presents significant challenges for Design-for-Test (DFT) engineers. Ensuring the thorough and efficient testing of these intrica... » read more

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