FinFETs and 5nm; building RISC-V; C pitfalls; rating security; TED talks; automotive security; Dennard scaling; testing UVM drivers; big.LITTLE considerations.
Is the end near for FinFETs? Applied’s Mike Chudzik digs into the impact of rising parasitic resistance and parasitic capacitance and the challenges of scaling to 5nm.
Cadence’s Paul McLellan checks out the method UC Berkeley is using to build RISC-V processors.
Mentor’s Colin Walls warns that in C even the simplest things, like the declaration of variables, have pitfalls for the unwary.
Synopsys’ Robert Vamosi looks at a proposal for the creation of a security rating system for software.
From the Industrial IoT to the details of product design, Ansys’ Sandy Adam recommends five TED talks focused on engineering and technology.
NXP’s Timo van Roermund argues there can be no automotive safety without adequate security measures and offers four security aspects to consider.
Rambus’ Aharon Etengoff investigates the breakdown of Dennard scaling and what it means for the future.
Verification blogger Tudor Timi digs into creating a testing environment for UVM drivers.
ARM’s Roy Hu provides a guide to high-level considerations for power management of a big.LITTLE system.
And if you missed last week’s IoT, Security & Automotive newsletter, check out these featured blogs:
Editor In Chief Ed Sperling contends that how a device behaves over time will be affected by other devices that were never considered.
Executive Editor Ann Steffora Mutschler observes that to reap the rewards from automotive opportunities, additional effort in design and verification is required.
Technology Editor Jeff Dorsch views a mega-merger as just the beginning.
Mentor Graphics’ Andrew Macleod looks for the optimum balance of electronic content in automotive design.
Rambus’ Asaf Ashkenazi argues that industry collaboration is essential to protect against a variety of attacks.
Kilopass Technology’s Lee Sun examines the differences between types of one-time programmable memory.