A basic primer on structure functions.
This whitepaper describes the role of thermal transient measurement to characterize semiconductor thermal behavior. It focuses on the value measurement derived structure functions provide through interpretation of the heat flow path inside a package for use in thermal characterization, failure diagnosis, and improving simulation thermal model accuracy.
Structure functions transform thermal transient measurement results into a thermal resistance versus thermal capacitance profile, which provides detailed thermal information of each layer the heat passes through, from junction to ambient. This enables identification of the physical characteristics of layers such as die attach, base, package, heatsink, and even cooling devices such as a fan.
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