Author's Latest Posts


Why Metal TIM Warpage Simulations Fail—And How To Fix Them


By Dambi Jo, JiHyun Kim, GaHyeon Kim, TaeKyeong Hwang, WonChul Do, and KyungRok Park In the semiconductor packaging industry, it is common practice to predict warpage and stress levels through simulation prior to actual product fabrication. This approach helps minimize the cost and time associated with prototype production [1]. The need for simulation-driven design and material optimization ... » read more

Redefining Backside Metallization: Low‑Temperature Solutions For HDFO And S‑SWIFT Designs


As chip performance and integration continue to advance, thermal dissipation control has become increasingly critical not only at the wafer fabrication level but also in the packaging industry. For artificial intelligence (AI) and high performance computing (HPC) applications, the industry is gradually shifting toward 2.5D integration. In response to the growing demand, High-Density Fan-Out (HD... » read more