category: Test, Measurement and Analytics

category: IoT, Security & Automotive

Streamlining Failure Analysis Of Chips
By Anne Meixner - 10 Oct, 2023 - Comments: 1

Experts at the Table: Semiconductor Engineering sat down to discuss how increasing complexity in semiconductor and packaging technology is driving shifts in failure analysis methods, with Frank Chen, director of applications and product management at Bruker Nano Surfaces & Metrology; Mike McIntyre, director of product management in the Enterprise Business Unit at Onto Innovation; Kamran Hak... » read more

Importance Of Certifications In Automotive IP
By Pawini Mahajan - 10 Oct, 2023 - Comments: 0

The automotive industry is renowned for its unwavering commitment to enforcing strict standards for enabling safety, quality, reliability, and security. However, upholding stringent measures to ensure vehicle safety and reliability has led to the need for predictive maintenance i.e., using advanced monitoring and analytical techniques as a part of Silicon Lifecycle Management (SLM) to anticipat... » read more

Delivering Real-Time Analytics To Semiconductor Test
By Eli Roth - 10 Oct, 2023 - Comments: 0

As defined by Moore’s Law, the semiconductor field has been growing at a steady pace since the 1960s. Concurrent with this progression, semiconductors are becoming more complex, densely integrated, and expensive to produce. While such advancements pose new challenges to semiconductor manufacturing, we can extend Moore’s Law well into the future by reimagining the way we approach the semicon... » read more

Particle Filter Material Choice For Raman And FTIR Microscopy
By Inga Koehler - 10 Oct, 2023 - Comments: 0

The filter material to analyze particulate matter with Raman or FTIR microspectroscopy plays a vital role. Their simple task is to filter liquids to isolate solids onto filters – but as soon as you introduce spectroscopic methods, the requirements on the filter increase drastically. But let’s start at the beginning: Which filters are at our disposal, and how do we select the right one for... » read more

Installing Yield Software Early In A Ramp Up
By Dieter Rathei - 10 Oct, 2023 - Comments: 0

In 1999, the White Oak Semiconductor Fab in Richmond, VA, was awarded the prestigious “Top Fab of the Year” (yes, that actually existed – proof attached!) by the leading semiconductor magazine of the time. Back then, I was a young engineer on the ramp up team and I recall that the reason we were chosen for the award was the incredibly short time in which we were able to ramp up production... » read more

Using Deep Data Analytics To Enhance Reliability Testing The Fast Roadmap for Zero Defects
By proteanTecs - 10 Oct, 2023 - Comments: 0

proteanTecs and ELES have partnered together to enhance reliability testing with deep data analytics. This collaboration enables SoC manufacturers to improve their qualification envelope to achieve lifetime reliability, shorten their root cause analysis time, and reduce operational costs. This innovative approach adds parametric measurements during the stress test in order to accurately and pre... » read more

Data, System Reliability, and Privacy
By Anne Meixner - 04 Oct, 2023 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss changes in test that address tracing device quality throughout a product’s lifetime, and over-arching concerns about data ownership and privacy, with Tom Katsioulas, CEO at Archon Design Solutions and U.S. Department of Commerce IoT advisory board member; Ming Zhang, vice president of R&D Acceleration at PDF Solutions; a... » read more

Chip Industry Week In Review
By The SE Staff - 15 Sep, 2023 - Comments: 0

By Gregory Haley, Jesse Allen, and Liz Allan TSMC told equipment vendors to delay deliveries of the most advanced tools due to uncertain demand, according to Reuters. The news drove down stock prices of all the major equipment providers. On the other hand, TSMC said advanced packaging shortages will constrain AI chip shipments for the next 18 months, according to NikkeiAsia. The United St... » read more

Fab And Field Data Transforming Manufacturing Processes
By Gregory Haley - 12 Sep, 2023 - Comments: 0

The ability to capture, process, and analyze data in the field is transforming semiconductor metrology and testing, providing invaluable insight into a product's performance in real-time and under real-world conditions and use cases. Historically, data that encapsulates parameters such as power consumption, temperature, voltages, currents, timing, and other characteristics, was confined to d... » read more

Customizing IC Test To Improve Yield And Reliability
By Ed Sperling - 12 Sep, 2023 - Comments: 0

Testing the performance and power of semiconductors as they come off the production line is beginning to shift left in the fab, reversing a long-standing trend of assessing chips just prior to shipping. While this may sound straightforward, it's a difficult challenge which, if successful, will have broad implications for the entire design-through-manufacturing flow. Manufacturers typically g... » read more

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