category: Whitepapers

category: IoT, Security & Automotive

Modeling Analytics for Computational Storage
By Samsung - 16 Feb, 2023 - Comments: 0

This paper discusses the expected performance benefits of offloading some important basic database operations — namely Scan, Filter and Project — to computational storage. We evaluate the performance estimate model using TPC-DS workload and two database engines running on Hadoop clusters: SPARK- SQL and Presto. This paper is organized as follows: after covering previous computational sto... » read more

American Innovation, American Growth: A Vision For The National Semiconductor Technology Center
By MITRE ENGENUITY - 16 Feb, 2023 - Comments: 0

In the paper, MITRE Engenuity and The Semiconductor Alliance take on the task of defining the principles by which the NSTC should be established to ensure that the U.S. makes the most of this opportunity to bring substantial funding and cross-sector collaboration to bear on the challenge of driving U.S. leadership in semiconductors for decades to come. Click here to read more. » read more

Improving Verification Predictability And Efficiency Using Big Data
By Siemens EDA - 08 Feb, 2023 - Comments: 0

Big data is a term that has been around for decades. It was initially defined as data sets captured, managed, and processed in a tolerable amount of time beyond the ability of normal software tools. The only constant in big data’s size over this time is that it’s been a moving target driven by improvements in parallel processing power and cheaper storage capacity. Today most of the industry... » read more

Using Machine Learning To Automate Debug Of Simulation Regression Results
By Synopsys - 08 Feb, 2023 - Comments: 0

Regression failure debug is usually a manual process wherein verification engineers debug hundreds, if not thousands of failing tests. Machine learning (ML) technologies have enabled an automated debug process that not only accelerates debug but also eliminates errors introduced by manual efforts. This white paper discusses how verification engineers can more efficiently analyze, bin, triage... » read more

Mechanical Characterization Of Ultra Low-k Dielectric Films
By Bruker - 08 Feb, 2023 - Comments: 0

Dielectric materials are of critical importance in the function of microelectronic devices because they electrically isolate conductive components from one another in microcircuits. Capacitance between conductors can limit a circuit’s maximum operating frequency, and the capacitance increases in inverse proportion to the separation distance between the conductors. Therefore, to minimize the s... » read more

Ion Implantation Applications For In-Line SIMS Metrology
By Nova - 08 Feb, 2023 - Comments: 0

In the semiconductor industry, ion implantation process has expanded to a wide range of applications with doses and energies spanning several orders of magnitude. Ion implantation is a very complicated process with many parameters and factors that affect the implant profile. For example, shadowing effects from higher aspect ratio of photoresist opening, ion channeling or de-channeling effect... » read more

Maintaining Vehicles Of The Future
By proteanTecs - 08 Feb, 2023 - Comments: 0

Driving a scalable, consumer-centric vision in the mobility industry, vehicles of thefuture will always be connected and differentiated by software. Advancements in software, hardware and their interaction are expanding the boundaries of performance, providing the foundation for next-generation cars. But the same technology that will make this vision a reality also presents new challenges. O... » read more

Best Practice: RANS Turbulence Modeling In Ansys CFD
By Ansys - 08 Feb, 2023 - Comments: 0

Turbulence modeling is one of the main sources of uncertainty in CFD simulations of technical flows. This is not surprising, as turbulence is the most complex phenomenon in classical physics. Turbulent flows pose a multi-scale problem, where the dimension of the technical device is often of the order of meters (or even 102 meters in case of airplanes and ships), whereas the smallest turbulence ... » read more

Project Centauri: Driving Rapid, Exponential IoT Growth With Arm-Based Microcontrollers
By Arm - 08 Feb, 2023 - Comments: 0

Project Centauri is Arm's microcontroller (MCU) platform software initiative, designed to solve common industry problems, reduce barriers to deployment, and enable scale across the Arm Cortex-M ecosystem. Read this white paper to explore: The components and deliverables of Project Centauri How this initiative addresses the needs of the MCU software ecosystem How to get involved wi... » read more

Intelligent Traceability For ISO 26262
By Siemens EDA - 01 Feb, 2023 - Comments: 0

Requirements driven development is a foundational component of any safety critical lifecycle, including ISO 26262, the state-of-the-art standard guiding safety in the development of automotive electronic devices. At face value, requirements seem like a very straight forward concept. Project teams write requirements. Requirements are implemented into the product. The product is tested... » read more

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