How Do You Qualify Tools For DO-254 Programs?


This paper describes the terminology and requirements related to tool qualification specific to the safety-critical programs governed by DO-254 compliance. It also provides some practical examples of tool qualification processes and strategies for commonly used tools. Qualifying tools for DO-254 While the use of state-of-the art development tools has led to ever increasing design complexity... » read more

Can Matter Finally Crack The Smart Home?


Can Matter bring greater security and reliable connectivity to the smart home? Read this whitepaper to find out. It covers: The current state of the smart home Growth markets in the smart home space Benefits Costs Click here to download. » read more

Expansion Of The IoT Brings New Security Challenges


The evolution of 5G technologies continues to drive advancement in Internet of Things (IoT) devices and their applications. By 2025, experts predict there will be nearly 4 billion IoT mobile connections in the world, and more than 64 billion IoT devices by 2026. In addition to enabling superior performance and efficiency, 5G expands the attack surface of applications and devices that run on ... » read more

PCB Design From Start To Finish: E-Book


This ebook by John Burkhert is a step-by-step guide on printed circuit board design with information suitable for beginners to graduate-level users. This series is for anyone who wants to design their own printed circuit boards or perform designs for others. While an electronics degree is not required, beginners would do well to consider basic electronic theory as a prerequisite. Each ... » read more

Addressing SRAM Verification Challenges


SureCore Limited is an SRAM IP company based in Sheffield, the United Kingdom, that develops low power memories for current and next generation silicon process technologies. Its award-winning, world-leading, low power SRAM designs are process independent and variability tolerant, making them suitable for a wide range of technology nodes. Two major product families have been announced: PowerM... » read more

AI-Driven Big Data Analytics Enables Actionable Intelligence, Improving SoC Design Productivity


As the latest systems on chip (SoCs) grow in size and complexity, a vast amount of design data is generated during verification and implementation. Design data is business critical and, with the proliferation of artificial intelligence (AI) use in chip design, provides designers an opportunity to carry forward learnings and insights with every new design. To achieve first-pass success deliverin... » read more

Faster And Smarter LVS For The SoC Era


Development of a modern system-on-chip (SoC) device is a long and incredibly complex process. Design teams rely on a huge range of tools, technologies, and methodologies to get the job done. Given the ongoing advances in silicon technology and design architecture, the tools are in a constant state of evolution. Logic-versus-schematic (LVS) checking is one of those tools. This is one of the earl... » read more

E-Mobility: Navigate Safety, Interoperability, And Conformance


Although the concept of electric vehicles (EV) has been around for a while, the EV and EV supply equipment (EVSE) markets are not well-regulated or fully operational. This presents several challenges for EV and EVSE manufacturers throughout the e-mobility ecosystem. Safety, interoperability, and conformance are important criteria for enabling e-mobility, and Keysight is ready to help. Read this... » read more

AI As A Service For Signal Processing


Reality Analytics provides AI tools, optimized for solving problems related to sensors and signals. Working with acceleration, vibration, sound, electrical, RF, and proprietary signal sets, Reality Analytics tools identify signatures of real-world events or conditions in sensor and signal data, and create software that can then spot those signals in the wild, notifying applications and devices ... » read more

Realization Of Sub-30-Pitch EUV Lithography Through The Application Of Functional Spin-On Glass


Photoresist metrics such as resolution, roughness, CD uniformity, and overall process window are often aimed to realize the full potential of EUV lithography. From the view of the materials supplier, improvements over the aforementioned metrics can be achieved by optimizing the functional materials used under the resist. The underlayers can significantly enhance the resist performance by provid... » read more

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