Chip Industry Technical Paper Roundup: May 28

Confidential computing for eRISC-V; SEM automatic defect inspection; energy-aware DL on resource-constrained HW; transforming 2DICs into 3DICs using shuttle chips from multi-project wafers; clock-to-clock modulation covert channel; coverage path planning for TIMs; doping mechanism of nitric oxide in high-performance P-type WSe2 transistors.

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New technical papers recently added to Semiconductor Engineering’s library:

Name of Paper Research Organizations
ACE: Confidential Computing for Embedded RISC-V Systems IBM and Max Planck
Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review KU Leuven and imec
Energy-Aware Deep Learning on Resource-Constrained Hardware Imperial College London and University of Cambridge
Die-Level Transformation of 2D Shuttle Chips into 3D-IC for Advanced Rapid Prototyping using Meta Bonding Tohoku University
Clock-to-Clock Modulation Covert Channel University of Rennes-INSA Rennes-IETR-UMR and University of South Brittany/Lab-STICC- UMR CNRS
TIMtrace: Coverage Path Planning for Thermal Interface Materials Karlsruhe Institute of Technology (KIT) and Robert Bosch GmbH
Uncovering the doping mechanism of nitric oxide in high-performance P-type WSe2 transistors Purdue University, MIT and National Yang Ming Chiao Tung University

Find more semiconductor research papers here.



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