CAN intrusion detection; probabilistic computing in MTJs; logic-locking Trojans; 5nm finFETs; non-volatile memory; SiC MOSFET performance; nano CMOS electronics; GaN HEMT for low noise applications.
New technical papers added to Semiconductor Engineering’s library this week.
| Technical Paper | Research Organizations |
|---|---|
| CANShield: Deep Learning-Based Intrusion Detection Framework for Controller Area Networks at the Signal-Level | Virginia Tech and others |
| Probabilistic computing with voltage-controlled dynamics in magnetic tunnel junctions | Northwestern University, University of Messina, Western Digital Corporation, and Universitat Jaume I |
| Logic Locking based Trojans: A Friend Turns Foe | University of Maryland and University of Florida |
| A Comprehensive RF Characterization and Modeling Methodology for the 5nm Technology Node FinFETs | IIT Kanpur, MaxLinear Inc., and University of California Berkeley |
| Novel Non-Volatile Memory Devices and Applications | University of California Berkeley |
| Improved Scheme for Estimating the Embedded Gate Resistance to Reproduce SiC MOSFET Circuit Performance | ROHM Company |
| Shockley-Read-Hall recombination and trap levels in In0.53 Ga0.47 As point defects from first principles | University of Glasgow and Synopsys Denmark |
| A Survey of GaN HEMT Technologies for Millimeter-Wave Low Noise Applications | Wright-Patterson AFB, Teledyne Scientific, HRL Laboratories, BAE Systems, Pseudolithic, Northrop Grumman Corporation, and University of California Santa Barbara |
More Reading
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