Why There Are Still No Commercial 3D-ICs

By Brian Bailey - 29 Jan, 2024 - Comments: 0

Building chips in three dimensions is drawing increased attention and investment, but so far there have been no announcements about commercial 3D-IC chips. There are some fundamental problems that must be overcome and new tools that need to be developed. In contrast, the semiconductor industry is becoming fairly comfortable with 2.5D integration, where individual dies are assembled on some k... » read more

Many More Hurdles In Heterogeneous Integration

By Laura Peters - 18 Jan, 2024 - Comments: 0

Advanced packaging options continue to stack up in the pursuit of “More than Moore” and higher levels of integration. It has become a place where many high-density interconnects converge, and where many new and familiar problems need to be addressed. The industry’s first foray into fine-pitch multi-die packaging utilized silicon interposers with through-silicon vias (TSVs) to deliver s... » read more

Navigating Heat In Advanced Packaging

By Gregory Haley - 18 Jan, 2024 - Comments: 0

The integration of multiple heterogeneous dies in a package is pivotal for extending Moore’s Law and enhancing performance, power efficiency, and functionality, but it also is raising significant issues over how to manage the thermal load. Advanced packaging provides a way to pack more features and functions into a device, increasingly by stacking various components vertically rather than ... » read more

Chip Industry Silos Are Crimping Advances

By Brian Bailey - 11 Jan, 2024 - Comments: 0

Change is never easy, but it is more difficult when it involves organizational restructuring. The pace of such restructuring has been increasing over the past decade, and often it is more difficult to incorporate than technological advancements. This is due to the siloed nature of the semiconductor industry, both within the industry itself, and its relationship to surrounding industries. Inc... » read more

Using Deep Data For Improved Reliability Testing

By Ed Sperling - 08 Jan, 2024 - Comments: 0

Reliability testing always has been a challenge for semiconductor companies, but it’s becoming much more difficult as devices continue to shrink, as they’re integrated together in advanced packages, and as they’re utilized under different conditions with life expectancy that varies by application and use case. Nir Sever, senior director of business development at proteanTecs, and Luca Mor... » read more

System-Driven PPA For Multi-Chiplet Designs

By Cadence - 20 Dec, 2023 - Comments: 0

As we approach the device scaling limitations at advanced nodes, the demand on compute performance and data transfer for hyperscale data center and AI designs is at an all-time high. Advanced systems-on-chip (SoCs) are reaching reticle size limits, and there has been a need to find innovative solutions to continue Moore’s law scaling and achieve performance improvements with reduced power. St... » read more

Next-Gen Power Integrity Challenges

By Ed Sperling - 14 Dec, 2023 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss power integrity challenges and best practices in designs at 7nm and below, and in 2.5D and 3D-IC packages, with Chip Stratakos, partner, physical design at Microsoft; Mohit Jain, principal engineer at Qualcomm; Thomas Quan, director at TSMC; and Murat Becer, vice president at Ansys. What follows are excerpts of that conversatio... » read more

Improving AI Productivity With AI

By Ed Sperling - 28 Nov, 2023 - Comments: 0

AI is showing up or proposed for nearly all aspects of chip design, but it also can be used to improve the performance of AI chips and to make engineers more productive earlier in the design process. Matt Graham, product management group director at Cadence, talks with Semiconductor Engineering about the role of AI in identifying patterns that are too complex for the human brain to grasp, how t... » read more

Thermal Warpage Simulation Of A Temperature-Dependent Linear Elastic Material Package

By Cadence - 08 Nov, 2023 - Comments: 0

The shift to advanced packaging in 3D and 2.5D IC design is making the numerical analysis of thermal warpage in electronic devices a crucial part of the design process. A reliable numerical tool enables the designer to perform early design analysis that accurately predicts warpage, thereby shortening the design process. The Cadence Celsius Thermal Solver integrated within the Cadence IC, pac... » read more

Anatomy Of A System Simulation

By Brian Bailey - 26 Oct, 2023 - Comments: 0

The semiconductor industry has greatly simplified analysis by consolidating around a small number of models and abstractions, but that capability is breaking down both at the implementation level and at the system level. Today, the biggest pressure is coming from the systems industry, where the electronic content is a small fraction of what must be integrated together. Systems companies tend... » read more

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Knowledge Centers
Entities, people and technologies explored

Shift Left Is The Tip Of The Iceberg

A transformative change is underway for semiconductor design and EDA. New languages, models, and abstractions will need to be created.

by Brian Bailey

Partitioning In The Chiplet Era

Understanding how chiplets interact under different workloads is critical to ensuring signal integrity and optimal performance in heterogeneous designs.

by Ann Mutschler

NAND Flash Targets 1,000 Layers

New techniques go beyond improved deposition and etching, but challenges stack up, too.

by Bryon Moyer

What Comes After HBM For Chiplets

The standard for high-bandwidth memory limits design freedom at many levels, but that is required for interoperability. What freedoms can be taken from other functions to make chiplets possible?

by Brian Bailey

Memory Fundamentals For Engineers

eBook: Nearly everything you need to know about memory, including detailed explanations of the different types of memory; how and where these are used today; what's changing, which memories are successful and which ones might be in the future; and the limitations of each memory type.

by The SE Staff

tag: 3D-IC