Heterogeneous Integration Issues And Developments

By Ed Sperling - 14 Dec, 2022 - Comments: 0

There are a slew of new developments in advanced packaging, from new materials, chiplets, and interconnect schemes, to challenges involving how to physically put chips in a package, metallization, thermal cycling, and parasitics in the interconnect path. Dick Otte, CEO of Promex Industries, talks about how this will change chip design and manufacturing, and how those changes are likely to unfol... » read more

Silent Data Corruption

By Ed Sperling - 12 Dec, 2022 - Comments: 0

Defects can creep into chip manufacturing from anywhere, but the problem is getting worse at advanced nodes and in advanced packages where reduced pin access can make testing much more difficult. Ira Leventhal, vice president of U.S. Applied Research and Technology at Advantest America, talks about what’s causing these so-called silent data errors, how to find them, and why it now requires ma... » read more

Variability Becoming More Problematic, More Diverse

By Karen Heyman - 12 Dec, 2022 - Comments: 0

Process variability is becoming more problematic as transistor density increases, both in planar chips and in heterogeneous advanced packages. On the basis of sheer numbers, there are many more things that can wrong. “If you have a chip with 50 billion transistors, then there are 50 places where a one-in-a-billion event can happen,” said Rob Aitken, a Synopsys fellow. And if Intel’s... » read more

Ready, Set, Go: Outrunning Moore’s Law With 3D-IC

By Tony Mastroianni - 08 Dec, 2022 - Comments: 0

By Anthony Mastroianni and Gordon Allan, Siemens EDA 3D ICs are an exciting and promising extension of heterogeneous advanced package technology into the third dimension. Although far from mainstream, 3D IC’s time is coming, as chiplet standardization efforts and supporting tool developments begin to make 3D IC practicable and profitable to more players – big and small – and products w... » read more

IC Stresses Affect Reliability At Advanced Nodes

By Ann Mutschler - 08 Dec, 2022 - Comments: 1

Thermal-induced stress is now one of the leading causes of transistor failures, and it is becoming a top focus for chipmakers as more and different kinds of chips and materials are packaged together for safety- and mission-critical applications. The causes of stress are numerous. In heterogeneous packages, it can stem from multiple components composed of different materials. “These materia... » read more

Advanced Auto-Routing For TSMC InFO Technologies

By Paul McLellan - 08 Dec, 2022 - Comments: 0

At the recent TSMC OIP Symposium, John Park presented 'Advanced Auto-Routing for TSMC InFO Technologies.' InFO stands for "integrated fanout" and is the lower performance, lower complexity technology for advanced packaging. For details of TSMC's whole packaging portfolio, see my post TSMC OIP: 3DFabric Alliance and 3Dblox. Here's the slide TSMC presented from that presentation on InFO. As you... » read more

Systematic Yield Issues Now Top Priority At Advanced Nodes

By Laura Peters - 06 Dec, 2022 - Comments: 0

Systematic yield issues are supplanting random defects as the dominant concern in semiconductor manufacturing at the most advanced process nodes, requiring more time, effort, and cost to achieve sufficient yield. Yield is the ultimate hush hush topic in semiconductor manufacturing, but it's also the most critical because it determines how many chips can be profitably sold. "At older nodes, b... » read more

The Computational Electromagnetics Simulation Challenge Of 3D-IC

By Kelly Damalou - 29 Nov, 2022 - Comments: 0

By Kelly Damalou and Matt Commens Innovation in semiconductor design today is energized primarily by AI/ML, data centers, autonomous and electric vehicles, 5G/6G, and IoT. Recently developed 2.5 and 3D-IC silicon-based packaging technologies have advanced the state of the art beyond SoC technologies which first united digital, analog, and memory functions on a single chip in the '90s. These ... » read more

An Organic Package Designer’s Guide To Transitioning To FOWLP And 2.5D Design

By Siemens EDA - 23 Nov, 2022 - Comments: 0

The IC packaging design tool set has matured to the point where it can address not only classic plastic, organic and ceramic packaging substrates but can also address silicon substrates driven by interposer and chiplet designs. In most cases system and packaging teams do not have to abandon their existing tool set to support these designs. In fact, the packaging design tool set can offer additi... » read more

Is UCIe Really Universal?

By Brian Bailey - 22 Nov, 2022 - Comments: 3

Chiplets are rapidly becoming the means to overcome the slowing of Moore's Law, but whether one interface is capable of joining them all together isn't clear yet. The Universal Chiplet Interconnect Express (UCIe) believes it will work, but some in the industry remain unconvinced. At least part of the problem is that interconnect standards are never truly finished. Even today, the protocols tha... » read more

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by Ann Mutschler

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Pros and cons of a middle-ground chiplet assembly that combines 2.5D and 3D-IC.

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Legacy Process Nodes Going Strong

The critical, and growing, significance of mature node chips and processes.

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AI’s Role In Chip Design Widens, Drawing In New Startups

Focus is on letting engineers do much more with the same or fewer resources — and less drudgery.

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Key Technologies To Extend EUV To 14 Angstroms

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eBook: Nearly everything you need to know about memory, including detailed explanations of the different types of memory; how and where these are used today; what's changing, which memories are successful and which ones might be in the future; and the limitations of each memory type.

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tag: advanced packaging

Heterogeneous Integration Issues And Developments

Silent Data Corruption

Variability Becoming More Problematic, More Diverse

Ready, Set, Go: Outrunning Moore’s Law With 3D-IC

IC Stresses Affect Reliability At Advanced Nodes

Advanced Auto-Routing For TSMC InFO Technologies

Systematic Yield Issues Now Top Priority At Advanced Nodes

The Computational Electromagnetics Simulation Challenge Of 3D-IC

An Organic Package Designer’s Guide To Transitioning To FOWLP And 2.5D Design

Is UCIe Really Universal?

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Entities, people and technologies explored