tag: automotive

Shifting Toward Data-Driven Chip Architectures
By Ed Sperling and Ann Mutschler - 16 Jun, 2021 - Comments: 0

An explosion in data is forcing chipmakers to rethink where to process data, which are the best types of processors and memories for different types of data, and how to structure, partition and prioritize the movement of raw and processed data. New chips from systems companies such as Google, Facebook, Alibaba, and IBM all incorporate this approach. So do those developed by vendors like Appl... » read more

Changes In Sensors And DSPs
By Ed Sperling - 14 Jun, 2021 - Comments: 0

Pulin Desai, group director for product marketing, management and business development at Cadence, talks about why processing is moving closer to the end point, how to save energy through reduced area and sensor fusion, and the impact of specialization, 3D capture and always-on circuits. » read more

Targeting Redundancy In ICs
By Brian Bailey - 14 Jun, 2021 - Comments: 0

Technology developed for one purpose is often applicable to other areas, but organizational silos can get in the way of capitalizing on it until there is a clear cost advantage. Consider memory. All memories are fabricated with spare rows and columns that are swapped in when a device fails manufacturing test. "This is a common method to increase the yield of a device, based on how much memor... » read more

How To Build A Virtual Electromagnetic Test Environment For Aerospace And Automotive Platforms
By Ansys - 09 Jun, 2021 - Comments: 0

To protect the electromagnetic compatibility (EMC) of complex systems like aircraft and automobiles, you need a full electromagnetic (EM) model. A virtual test environment allows you to assess a design and ensure system-level compatibility before physical testing. This process has been proven to save more than $1 million compared to an approach based solely on testing. Learn how to build a v... » read more

3 Technologies That Will Challenge Test
By Ed Sperling - 08 Jun, 2021 - Comments: 0

As chips are deployed in more complex systems and with new technologies, it's not clear exactly what chipmakers and systems vendors will be testing. The standard tests for voltage, temperature and electrical throughput still will be needed, of course. But that won't be sufficient to ensure that sensor fusion, machine learning, or millimeter wave 5/6G will be functioning properly. Each of tho... » read more

Reliability Costs Becoming Harder To Track
By Ed Sperling And Susan Rambo - 08 Jun, 2021 - Comments: 0

Ensuring reliability in chips is becoming more complex and significantly more expensive, shifting left into the design cycle and right into the field. But those costs also are becoming more difficult to define and track, varying greatly from one design to the next based upon process node, package technology, market segment, and which fab or OSAT is used. As the number of options increases fo... » read more

The Emergence Of Inline Screening For High Volume Manufacturing
By KLA - 08 Jun, 2021 - Comments: 0

The semiconductor content of automobiles is growing rapidly in applications where quality is of paramount importance, and automotive manufacturers have taken the lead in driving a “Zero Defect” mentality into their supply chain. The motivation behind this paper started with engagements with semiconductor suppliers as well as automotive manufacturers, where KLA witnessed many clear examples ... » read more

Making Lidar More Useful
By Ed Sperling - 07 Jun, 2021 - Comments: 0

Lidar, one of a trio of “vision” technologies slated for cars of the future, is improving both in terms of form and function. Willard Tu, director of automotive at Xilinx, talks with Semiconductor Engineering about different approaches and tradeoffs between cost, compute intensity and resolution, various range and field of view options, and why convolutional neural networks are so important... » read more

Automotive AI Hardware: A New Breed
By Kurt Shuler - 03 Jun, 2021 - Comments: 0

Arteris IP functional safety manager Stefano Lorenzini recently presented “Automotive Systems-on-Chip (SoCs) with AI/ML and Functional Safety” at the Linley Processor Conference. A main point of the presentation was that conventional wisdom on AI hardware markets is binary. There’s AI in the cloud: Big, power-hungry, general-purpose. And there’s AI at the edge: Small, low power, limited... » read more

Three Steps To ISO 26262 Fault Campaign Closure
By Jacob Wiltgen - 03 Jun, 2021 - Comments: 0

The complexity of automotive ICs continues to grow exponentially, challenging even the most veteran teams to deliver innovative products to market while simultaneously ensuring safety through the operational life of the product. This is the purpose of safety verification. Its primary objective is to understand whether the safety architecture sufficiently prevents random failures from violati... » read more

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