tag: DFT

DAC Day Three: UVM, Machine Learning And DFT Come Together
By Brian Bailey - 08 Jun, 2016 - Comments: 0

The industry and users have a love/hate relationship with UVM. It has quickly risen to become the most used verification methodology and yet at the same time it is seen as being overly complex, unwieldy and difficult to learn. The third day of DAC gets started with breakfast with Accellera to discuss UVM and what we can expect to see in the next 5 years. The discussion was led by Tom Alsop, pri... » read more

The Week In Review: Design/IoT
By Jesse Allen - 09 Oct, 2015 - Comments: 0

Imec and Cadence completed the first tapeout of a 5nm test chip. Using a processor design, the companies taped out a set of designs using EUV lithography as well as Self-Aligned Quadruple Patterning for 193i lithography, where metal pitches were scaled from the nominal 32nm pitch down to 24nm to push the limit of patterning. Tools Synopsys folded in recent acquisition Atrenta's testabilit... » read more

Full AMS Design Flow For The IoT
By Mentor, a Siemens Business - 27 Aug, 2015 - Comments: 0

By Nicolas Williams and Jeff Miller The pressure for a new generation of (analog/mixed-signal) AMS design capabilities has been accelerated by the sudden demand for Internet of Things (IoT). These inexpensive devices are used in an expanding array of scenarios on the edge of the network — thus the demand for an AMS design environment that is affordable and easy to use, but powerful enough ... » read more

Gate-Level Simulation Methodology
By Cadence - 26 Aug, 2015 - Comments: 0

The increase in design sizes and the complexity of timing checks at 40nm technology nodes and below is responsible for longer run times, high memory requirements, and the need for a growing set of gate-level simulation (GLS) applications including design for test (DFT) and low- power considerations. As a result, in order to complete the verification requirements on time, it becomes extr... » read more

Divide And Conquer: Hierarchical DFT For SoC Designs
By Mentor, a Siemens Business - 13 Nov, 2014 - Comments: 0

Large System on Chip (SoC) designs present many challenges to all design disciplines, including design-for-test (DFT). By taking a divide-and-conquer approach to test, significant savings in tool runtime and memory consumption can be realized. This whitepaper describes the basic components of a hierarchical DFT methodology, the benefits that it provides, and the tool automation that is availabl... » read more

Balancing The Cost Of Test
By Brian Bailey - 23 Oct, 2014 - Comments: 0

As semiconductor devices became larger and more complex, the cost of [getkc id="174" kc_name="test"] increased. Testers were large pieces of capital equipment designed to execute functional vectors at-speed and the technology being used had to keep up with increasing demands placed on them. Because of this, the cost of test did not decrease in the way that other high-tech equipment did. Around ... » read more

Designing And Testing FinFET-based IC Designs
By Mentor Graphics Staff Writers - 19 Jun, 2014 - Comments: 0

By Carey Robertson and Steve Pateras The emergence of FinFET transistors has had a significant impact on the IC physical design and design-for-test flows. The introduction of FinFETs means that CMOS transistors must be modeled as three-dimensional (3D) devices during the IC design process, with all the complexity and uncertainty this entails. The BSIM Group of the UC Berkeley Device Group has ... » read more

Five Disruptive Test Technologies
By Mark LaPedus - 19 Jun, 2014 - Comments: 0

For years, test has been a critical part of the IC manufacturing flow. Chipmakers, OSATs and the test houses buy the latest testers and design-for-test (DFT) software tools in the market and for good reason. A plethora of unwanted field returns is not acceptable in today’s market. The next wave of complex chips may require more test coverage and test times. That could translate into higher... » read more

The Week In Review: Design
By Ed Sperling - 06 Jun, 2014 - Comments: 0

Tools Mentor Graphics rolled out embedded Linux software for AMD’s x86 G-series SoCs, code-named Steppe Eagle and its Crowned Eagle CPUs. Ansys-Apache and TowerJazz have created a power noise and reliability signoff design kit, including reference flow guidelines, test case examples and flow setup guidance. Synopsys updated its verification portfolio with static and formal tools for CD... » read more

Test Challenges Grow
By Mark LaPedus - 27 May, 2014 - Comments: 3

Semiconductor Engineering sat down to discuss current and future test challenges with Dave Armstrong, director of business development at Advantest; Steve Pateras, product marketing director for Silicon Test Solutions at Mentor Graphics; Robert Ruiz, senior product marketing manager at Synopsys; Mike Slessor, president of FormFactor; and Dan Glotter, chief executive of Optimal+. SE: In our ... » read more

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