tag: ESD

Good Times For Analog Designers
By Ann Mutschler - 14 Feb, 2013 - Comments: 1

By Ann Steffora Mutschler For a number of technological reasons, analog/mixed-signal design and low-power design are converging, and with that comes both challenges and opportunities. As far as challenges go, process variations at 14nm, 20nm and even 28nm have increased significantly to include DFM impacts such as layout-delay effects. On the digital side, those process changes affect... » read more

All Indicators Point North
By Ed Sperling - 28 Jun, 2012 - Comments: 0

Designing and producing chips has always been difficult, but the number of things that conspire to make it harder at 20nm is the longest in the history of the semiconductor industry. The list will grow longer still at 14nm and beyond, not to mention so expensive that one mistake will kill a company. While system engineers and architects look at the challenges on the front end, the problems ... » read more

New Reliability Issues
By Arvind Vel - 14 Jun, 2012 - Comments: 0

By Arvind Shanmugavel Reliability of ICs is a topic of growing concern with every technology node migration. With the onset of the 20nm process node from different foundries, reliability verification has taken center stage in design kits—and for good reason. Reliability margins have continued to decrease and have reached an inflection point at the 20nm node. The design and EDA communities ha... » read more

Tech Talk: Power Issues Ahead
By Ed Sperling - 31 May, 2012 - Comments: 0

Aveek Sarkar, vice president of technology and support at ANSYS Apache, talks with Low-Power Engineering about growing concerns over electrostatic discharge, electromigration, the impact of stacked die, and the need for power and thermal models. [youtube vid=-7TtszsuZP0] » read more

Reliability Verification For Smart ICs
By Arvind Vel - 05 Apr, 2012 - Comments: 0

By Arvind Shanmugavel The electronic brains behind today’s advanced systems are smart ICs, paving the way for consumer electronics, energy, biomedical, automotive and avionics industries. Power efficiency and system integration are keys to the success of these smart systems. The IC industry has swiftly responded with state-of-the-art low-power techniques and chip integration initiatives f... » read more

The Shocking Side Of 3D
By Ed Sperling - 17 Mar, 2011 - Comments: 0

By Ann Steffora Mutschler The pesky static charge that builds up on your clothing when you forget the dryer sheet is more than just a nuisance when it comes to manufacturing ICs. Add 3D structures and process scaling to the mix and the challenge of adequately protecting those devices grows significantly. While this problem used to be largely an afterthought, the charged-device model type of... » read more

Changes In The Ecosystem
By Ed Sperling - 09 Sep, 2010 - Comments: 0

By Ed Sperling For the better part of two decades, semiconductor companies have been talking about ecosystems mostly for marketing and economic reasons. They’re now talking thinking about ecosystems for complex technology reasons that involve integrated models for power, transactions and manufacturability. In the late 1990s, IBM began assembling its own loose ecosystem as a way of shieldi... » read more

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