tag: Fraunhofer IIS EAS

Dynamic Fault Injection For System-Level Simulation Of MEMS
By Fraunhofer IIS/EAS - 08 Aug, 2018 - Comments: 0

In this paper a method for dynamic fault injection and fault simulation as well as its application to MEMS based sensor systems is described. The prerequisite for this approach is the availability of accurate, but numerically efficient models for the MEMS element. Simulations based on SystemC and SystemC AMS are suitable to analyze the nominal behavior of complex sys- tems including electronics... » read more

Return Of The Organic Interposer
By Ed Sperling - 06 Aug, 2018 - Comments: 2

Organic interposers are resurfacing as an option in advanced packaging, several years after they were first proposed as a means of reducing costs in 2.5D multi-die configurations. There are several reasons why there is a renewed interest in this technology: More companies are pushing up against the limits of Moore's Law, where the cost of continuing to shrinking features is exorbitant. ... » read more

More Sigmas In Auto Chips
By Ann Mutschler - 02 Aug, 2018 - Comments: 0

The journey to autonomous cars is forcing fundamental changes in the way chips are designed, tested and tracked, from the overall system functionality to the IP that goes into those systems. This includes everything from new requirements for automotive-grade chips to longer mean time between failures. But it also makes it far more challenging, time-consuming and complicated to create these d... » read more

Safety, Security And PPA Tradeoffs
By Brian Bailey - 23 Jul, 2018 - Comments: 0

Safety and security are emerging as key design tradeoffs as chips are added into safety-critical markets, adding even more complexity into an already complicated optimization process. In the early days of semiconductor design, performance and area were traded off against each other. Then power became important, and the main tradeoffs became power, performance and area (PPA). But as chips inc... » read more

Aging Effects
By Ed Sperling - 17 Jul, 2018 - Comments: 0

Tech Talk: Fraunhofer EAS' group manager for quality and reliability, Andre Lange, talks about how to model aging effects and why the problems are becoming more difficult at advanced nodes. https://youtu.be/XHWww2PE7aY » read more

5nm Design Progress
By Ann Mutschler - 17 Jul, 2018 - Comments: 1

Activity surrounding the 5nm manufacturing process node is quickly ramping, creating a better picture of the myriad and increasingly complex design issues that must be overcome. Progress at each new node after 28nm has required an increasingly tight partnership between the foundries, which are developing new processes and rule decks, along with EDA and IP vendors, which are adding tools, met... » read more

IoT Wireless Battles Ahead
By Brian Bailey - 18 Jun, 2018 - Comments: 0

"The good thing about standards is that there are so many to choose from." – Andrew S. Tanebaum The extended version of that quote adds "furthermore, if you do not like any of them, you can just wait for next year's model." That could not be truer when it comes to IoT and wireless connectivity. Every standards group is rushing to create new versions of existing standards that use less p... » read more

Upcoming System Modeling Challenges
By Stephan Gerth - 14 Jun, 2018 - Comments: 0

In the past, during the concept phase of a design, system models have typically lacked information regarding reliability. If at all, reliability was addressed late in the design phase shortly before tape out. As the functional safety aspect, and with it an extended device lifetime, gains more and more attention for certain applications, things have to change in the design processes. To ensure a... » read more

Chip Dis-Integration
By Brian Bailey - 14 Jun, 2018 - Comments: 2

Just because something can be done does not always mean that it should be done. One segment of the semiconductor industry is learning the hard way that continued chip integration has a significant downside. At the same time, another another group has just started to see the benefits of consolidating functionality onto a single substrate. Companies that have been following Moore's Law and hav... » read more

Near-Threshold Issues Deepen
By Ann Mutschler - 14 Jun, 2018 - Comments: 0

Complex issues stemming from near-threshold computing, where the operating voltage and threshold voltage are very close together, are becoming more common at each new node. In fact, there are reports that the top five mobile chip companies, all with chips at 10/7nm, have had performance failures traced back to process variation and timing issues. Once a rather esoteric design technique, near... » read more

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