Machine Learning For IC Production


Semiconductor Engineering sat down to discuss artificial intelligence (AI), machine learning, and chip and photomask manufacturing technologies with Aki Fujimura, chief executive of D2S; Jerry Chen, business and ecosystem development manager at Nvidia; Noriaki Nakayamada, senior technologist at NuFlare; and Mikael Wahlsten, director and product area manager at Mycronic. What follows are excerpt... » read more

Testing AI Systems


AI is booming. It's coming to a device near you—maybe even inside of you. And AI will be used to design, manufacture and even ship those devices, regardless of what they are, where they are used, or how they are transported. The big questions now are whether these systems work, for how long—and what do those metrics even mean? An AI system, or AI-enhanced system, is supposed to adapt ove... » read more

Top Stories For 2018


Each year, I look back to see what articles people like to read. The first thing that has amazed me each year at Semiconductor Engineering is that what should be a strong bias towards articles published early in the year never seems to play out. The same is true this year. More than half of the top articles were published after July. The second thing that remains constant is that people love... » read more

Fundamental Shifts In 2018


What surprised the industry in 2018?  While business has been strong, markets are changing, product categories are shifting and clouds are forming on the horizon. As 2018 comes to a close, most companies are pretty happy with the way everything turned out. Business has been booming, new product categories developing, and profits are meeting or beating market expectations. "2018 was indeed a... » read more

Can Graphene Be Mass Manufactured?


Since the isolation of graphene in 2004, the high mobility and unique transport properties of 2-dimensional semiconductors have tantalized physicists and materials scientists. Their in-plane carrier transport and lack of dangling bonds potentially can minimize line/edge scattering and other effects of extreme scaling. While 2-D materials cannot compete with silicon at current device dime... » read more

The State Of MEMS Process Standardization


SEMI spoke with Udo Gómez, senior vice president at Robert Bosch GmbH, about MEMS technology requirements relative to standard IC design and manufacturing. Gómez highlighted solutions to challenges of MEMS technology development and manufacturing ahead of his presentation at the 22nd Fab Management Forum at SEMICON Europa 2018, 13-16, November 2018, in Munich, Germany. To register for the... » read more

Variability In Chip Manufacturing


Brewer Science’s Jim Korich talks about how to deal with variability in processes and why consistency in materials is so important at advanced nodes. https://youtu.be/U1KkUmtmqpE » read more

The Value of Runtime Knowledge Management


In clinical and commercial manufacturing when measures are taken to prevent deviations, the findings aren’t often shared across the enterprise and when corrective actions are taken to resolve an issue, they often don’t address the actual root cause(s). The Applied SmartFactory® Rx™ Knowledge Management solution allows knowledge captured in the R&D and design phases to be used th... » read more

Combining Human Intelligence And Smart Machines


By Nancy Greco, Dave Mayewski, James Moyne, Paul Werbaneth The spacecraft Discovery and its HAL 9000 computer system had a digital twin. Stanley Kubrick’s seminal film “2001: A Space Odyssey” had its theatrical release 50 years ago this April. “2001” isn’t just a great science fiction film. Rather, it’s a great work of cinema overall, across any category. (The American Film... » read more

Innovative Scalable Design-Based Care Area Methodology For Defect Monitoring In Production


By Ian Tolle, GlobalFoundries, and Ankit Jain, KLA-Tencor Abstract The use of design-based care areas on inspection tools [1, 2] to characterize defects has been well established in recent years. However, the implementation has generally been limited to specific engineering use cases, due to the complexity involved with care area creation and inspection recipe setup. Furthermore, creating, ... » read more

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