High Throughput Noise Measurements


Flicker noise and random telegraph noise (RTN) testing can take a long time, especially when measuring down to frequencies of 1 Hz or below. Sweep times up to 30 min at a single temperature are common. And standard data collection for device models requires DUT data at multiple temperatures on small pads. To lower Cost of Test (CoT), and significantly increase on-wafer test throughput, a... » read more

112G SerDes Reliability


Priyank Shukla, product marketing manager at Synopsys, digs into 112Gbps SerDes, why it’s important to examine the performance of these devices in the context of a system, what is acceptable channel loss, and how density can affect performance, power and noise. » read more

Integrity Problems For Edge Devices


Battery-powered edge devices need to save every picojoule of energy they can, which often means running at very low voltages. This can create signal and power integrity issues normally seen at the very latest technology nodes. But because these tend to be lower-volume, lower-cost devices, developers often cannot afford to perform the same level of analysis on these devices. Noise can come in... » read more

Problems And Solutions In Analog Design


Advanced chip design is becoming a great equalizer for analog and digital at each new node. Analog IP has more digital circuitry, and digital designs are more susceptible to kinds of noise and signal disruption that have plagued analog designs for years. This is making the design, test and packaging of SoCs much more complicated. Analog components cause the most chip production test failures... » read more

Challenges For Compute-In-Memory Accelerators


A compute-in-memory (CIM) accelerator does not simply replace conventional logic. It's a lot more complicated than that. Regardless of the memory technology, the accelerator redefines the latency and energy consumption characteristics of the system as a whole. When the accelerator is built from noisy, low-precision computational elements, the situation becomes even more complex. Tzu-Hsian... » read more

Is Common Resistance Affecting Your Analog Design Reliability And Performance?


Integrated circuit (IC) design reliability has always been important and essential to market success. After all, if no one could count on your product to operate as designed, and for as long as intended, there wouldn’t be many buyers! However, given the increase in the types and complexity of design applications, coupled with the increasing technological challenge of manufacturing at advance... » read more

Making Sense Of PUFs


As security becomes a principal design consideration, physically unclonable functions (PUFs) are seeing renewed interest as new players emerge onto the market. PUFs can play a central role in hardware roots of trust (HRoTs), but the messaging in the market can make it confusing to understand the different types of PUF as well as their pros and cons. PUFs leverage some uncertain aspect of som... » read more

Designing Resilient Electronics


Electronic systems in automobiles, airplanes and other industrial applications are becoming increasingly sophisticated and complex, required to perform an expanding list of functions while also becoming smaller and lighter. As a result, pressure is growing to design extremely high-performance chips with lower energy consumption and less sensitivity to harsh environmental conditions. If this ... » read more

HBM Issues In AI Systems


All systems face limitations, and as one limitation is removed, another is revealed that had remained hidden. It is highly likely that this game of Whac-A-Mole will play out in AI systems that employ high-bandwidth memory (HBM). Most systems are limited by memory bandwidth. Compute systems in general have maintained an increase in memory interface performance that barely matches the gains in... » read more

Improving Circuit Reliability


Carey Robertson, product marketing director at Mentor, a Siemens Business, examines reliability at advanced and mainstream nodes, particularly in automotive and industrial applications, what’s driving growing concern about the reliability and fidelity of analog circuits, and the impact of running circuits for longer periods of time under different voltage and environmental conditions. » read more

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