Chip-Package Co-Analysis Using Ansys RedHawk-CPA


Ansys RedHawk-CPA is an integrated chip–package co-analysis solution that enables quick and accurate modeling of the package layout for inclusion in on-chip power integrity simulations using Ansys RedHawk. With RedHawk-CPA a designer can perform static IR drop analysis and AC hotspot analysis of the package layout following RedHawk static and dynamic analyses respectively. To ensure a reliab... » read more

Redefining The Power Delivery Network


Reliably getting power around a package containing multiple dies, potentially coming from multiple sources, or implemented in diverse technologies, is becoming much more difficult. The tools and needed to do this in an optimized manner are not all there today. Nevertheless, the industry is confident that we can get there. For a single die, the problem has evolved slowly over time. "For a ... » read more

Power Impacting Cost Of Chips


The increase in complexity of the power delivery network (PDN) is starting to outpace increases in functional complexity, adding to the already escalating costs of modern chips. With no signs of slowdown, designers have to ensure that overdesign and margining do not eat up all of the profit margin. The semiconductor industry is used to problems becoming harder at smaller geometries, but unti... » read more

Designing SoC Power Networks


Designing a power network for a complex SoC is becoming critical for the success of the product, but most chips are still using old techniques that are ill-suited to the latest fabrication technologies, resulting in an expensive, overdesigned product. Not only is the power network as designed too large, but this has several knock-on effects that impact area, timing and power. In the first pa... » read more

SoC Power Grid Challenges


The consumption of power and dissipation of heat within large SoCs has received a lot of attention recently, but that is only part of the issue. Power also has to be reliably delivered onto and around the system. This is becoming increasingly difficult, and new nodes are adding to the list of challenges. "If we were building chips where there was only a single Vdd and Vss then it is not that... » read more

Power Delivery Network Verification Coverage


This paper presents a methodology for comprehensive power grid verification coverage, including identification of power grid weaknesses early in the design cycle. To view this white paper, click here. » read more

New Reliability Issues


By Arvind Shanmugavel Reliability of ICs is a topic of growing concern with every technology node migration. With the onset of the 20nm process node from different foundries, reliability verification has taken center stage in design kits—and for good reason. Reliability margins have continued to decrease and have reached an inflection point at the 20nm node. The design and EDA communities ha... » read more