Improving Concurrent Chip Design, Manufacturing, And Test Flows


Semiconductor design, manufacturing, and test are becoming much more tightly integrated as the chip industry seeks to optimize designs using fewer engineers, setting the stage for greater efficiencies and potentially lower chip costs without just relying on economies of scale. The glue between these various processes is data, and the chip industry is working to weave together various steps t... » read more

Addressing Three Big Challenges In Silicon Realization


There is no better way to gain insight into prevailing technical challenges than bringing together industry experts to share experiences and proposed solutions. Silicon realization—the ability to design and build today’s complex semiconductors—is one domain with no shortage of challenges. The quest for the best power, performance, and area, and delivery of first-time-right silicon, requir... » read more

The Rise Of Copper Wires In Automotive ICs


In 2011, the price of Gold (Au) surged to $1900/oz which had a drastic impact on Wirebonded ICs using Au wires. IC suppliers scrambled to convert from Au to copper (Cu) wire on as many products as they could. However, automotive ICs were reluctant to make the jump due to lack of reliability data and performance track-record. However, today’s automotive ICs are big users of Cu wires driven by ... » read more

Ensuring Memory Reliability Throughout the Silicon Lifecycle


By Anand Thiruvengadam and Guy Cortez Memories are everywhere in modern electronics. Discrete memory chips account for much of the space on printed circuit boards (PCBs). Embedded memories consume much of the floorplan in system-on-chip (SoC) devices. Many multi-die chip configurations, including 2.5D/3DIC devices, are driven by the need for faster memory access. Designing and verifying memo... » read more

Next Steps For Improving Yield


Chipmakers are ramping new tools and methodologies to achieve sufficient yield faster, despite smaller device dimensions, a growing number of systematic defects, immense data volumes, and massive competitive pressure. Whether a 3nm process is ramping, or a 28nm process is being tuned, the focus is on reducing defectivity. The challenge is to rapidly identify indicators that can improve yield... » read more

Automated Optical Inspection


Building good automated models for inspection require more data to be collected, both good and bad. Vijay Thangamariappan, R&D engineer at Advantest, explains how to develop models for automating optical inspection, using a multi-thousand pin socket as an example for how machine learning has helped reduce the return rate due to defects from 2% down to zero. He also explains how to achieve t... » read more

Bug-Free Designs


It is possible in theory to create a design with no bugs, but it's impractical, unnecessary, and extremely difficult to prove for bugs you care about. The problem is intractable because the potential state space is enormous for any practical design. The industry has devised ways to handle this complexity, but each has limitations, makes assumptions, and employs techniques that abstract the p... » read more

EVs Raise Energy, Power, And Thermal IC Design Challenges


The transition to electric vehicles is putting pressure on power grids to produce more energy and on vehicles to use that energy much more efficiently, creating a gargantuan set of challenges that will affect every segment of the automotive world, the infrastructure that supports it, and the chips that are required to make all of this work. From a semiconductor standpoint, improvements in th... » read more

Robust Latch Hardened Against QNUs for Safety-Critical Applications in 22nm CMOS Technology


A technical paper titled "Cost-Optimized and Robust Latch Hardened against Quadruple Node Upsets for Nanoscale CMOS" was just published by researchers at Anhui University, Hefei University of Technology, Anhui Polytechnic University, Kyushu Institute of Technology, and the University of Montpellier/CNRS. Abstract: "With the aggressive reduction of CMOS transistor feature sizes, the soft ... » read more

TCAD-Based Radiation Modeling Technique For Reliable Aerospace Chips


By Ian Land and Ricardo Borges We demand a lot from the electronic components that bring our devices and systems to life. This is particularly true when it comes to semiconductors for space applications. From satellites to spacecraft, aerospace and defense equipment must tolerate the most extreme of operating conditions in order to perform their jobs safely and reliably. How do you ensure... » read more

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