tag: test

Blog Review: April 2
By Ed Sperling - 02 Apr, 2014 - Comments: 0

Mentor’s Nazita Saye compares roadway roundabouts to networked systems. One roundabout works fine, but add in a bunch of them and you have a massive traffic jam. How many roundabouts are in your design? Cadence’s Richard Goering interviews Stan Kroliskoski, chair of the IEEE Design Automation Standards Committee, about four working groups on EDA standards and what’s ahead. Speaking ... » read more

Enabling Test Portability With Graphs
By Ann Mutschler - 20 Mar, 2014 - Comments: 0

Is it time to move up again? When it comes to test portability between simulation, emulation, prototypes and silicon, as well as an easier way to create a test structure, the answer appears to be a resounding ‘Yes.’ Looking at these activities from a higher level of abstraction and using a graph-based approach should allow automation where there has been none previously, and could allow val... » read more

Test Challenges Rising For Mobile Devices
By Mark LaPedus - 20 Mar, 2014 - Comments: 0

Smartphone and tablets continue to advance at a dizzying pace. On the component side alone, the latest mobile devices are moving towards 64-bit application processors, multi-mode RF front-ends, higher-end cameras and flashy LCD screens. Some systems even boast fingerprint scanners and heart rate sensors. But an obvious part of the system continues to lag behind the curve—battery life. In r... » read more

More Pain In More Places
By Ed Sperling - 14 Mar, 2014 - Comments: 2

Pain is nothing new in to the semiconductor industry. In fact, the pain of getting complex designs completed on budget, and finding the bugs in those designs, has been responsible for decades of continuous growth in EDA, IP, test, packaging, and foundries. But going forward there is change afoot in every segment of the flow from architecture to design to layout to verification to manufacturi... » read more

SoC Integration Mistakes
By Ed Sperling - 26 Feb, 2014 - Comments: 1

Semiconductor Engineering sat down to discuss integration challenges with Ruggero Castagnetti, distinguished engineer at LSI; Rob Aitken, an ARM fellow; Robert Lefferts, director of engineering in Synopsys’ Solutions Group; Bernard Murphy, chief technology officer at Atrenta; and Luigi Capodieci, R&D fellow at GlobalFoundries. What follows are excerpts of that roundtable discussion. S... » read more

Plug-And-Play Test Strategy For 3D ICs
By Various Writers - 26 Feb, 2014 - Comments: 0

As the industry transitions to 3D ICs, new test strategies are being developed to meet to two 3D IC test goals: improving the pre-packaged test quality and establishing new tests between the stacked die. Solutions for 3D IC test are developing rapidly and are based on mature technologies. In this paper, we describe a test strategy for 3D ICs based on a plug-and-play architecture that allows die... » read more

ATE Platform Strategy Gains Ground
By Kenji Tsuda - 10 Feb, 2014 - Comments: 0

More than a decade ago, at the urging of Intel, the ATE industry set out to reduce the cost of test in the digital chip market. Backed by companies such as Intel, Motorola, Renesas, Advantest and others, they formed an ATE consortium to make this all work. The aim of the consortium was to devise an "open architecture" for ATE. This would enable the development of third-party plug-and-play m... » read more

Experts At The Table: Yield And Reliability Issues With Integrating IP
By Ed Sperling - 08 Jan, 2014 - Comments: 0

Semiconductor Engineering sat down to discuss the impact of integrating IP in complex SoCs with Juan Rey, senior director of engineering at Mentor Graphics; Kevin Yee, product marketing director for Cadence’s SoC Realization Group; and Mike Gianfagna, vice president of marketing at eSilicon. What follows are excerpts of that conversation. SE: Do we need to move to subsystems or more restri... » read more

Where Is 2.5D?
By Ed Sperling - 19 Dec, 2013 - Comments: 3

After nearly five years of concentrated research, development, test chips and characterization, 2.5D remains a possibility for many companies but a reality for very few. So what’s taking so long and why hasn’t all of this hype turned into production runs instead of test chips? Semiconductor Engineering spent the past two months interviewing dozens of people on this subject, from chipmakers ... » read more

Experts At The Table: Yield And Reliability Issues With Integrating IP
By Ed Sperling - 12 Dec, 2013 - Comments: 0

Semiconductor Engineering sat down to discuss the impact of integrating IP in complex SoCs with Juan Rey, senior director of engineering at Mentor Graphics; Kevin Yee, product marketing director for Cadence’s SoC Realization Group; and Mike Gianfagna, vice president of marketing at eSilicon. What follows are excerpts of that conversation. SE: As more pieces are integrated into complex SoCs... » read more

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