IC Yield Issues

By Ed Sperling - 27 May, 2011 - Comments: 0

What makes one semiconductor design yield better than another. And what issues are we likely to face going forward. Semiconductor Manufacturing & Design questions Amiad Conley from Applied Materials; Cyrus Tabery from GlobalFoundries; Brady Benware from Mentor Graphics, and Ankush Oberai from Magma. [youtube vid=1YjY436YmNQ] » read more

Experts At The Table: Yield Issues

By Ed Sperling - 22 Apr, 2011 - Comments: 0

By Ed Sperling Semiconductor Manufacturing & Design sat down to discuss yield with Amiad Conley, technology marketing manager for yield and process control at Applied Materials; Cyrus Tabery, senior member of the GlobalFoundries technical staff for lithography development and DFM; Brady Benware, engineering manager for diagnosis and yield at Mentor Graphics, and Ankush Oberai, general man... » read more

Experts At The Table: Yield Issues

By Ed Sperling - 10 Apr, 2011 - Comments: 0

Experts At The Table: Yield Issues

By Ed Sperling - 27 Mar, 2011 - Comments: 0

Rethinking Test

By Ann Mutschler - 11 Feb, 2010 - Comments: 0

By Ann Steffora Mutschler The responsibility of semiconductor test has long sat solely with the test engineer as the chip designer focused on the functionality of the device. However, particularly in low-power designs, when the device is being tested, much higher power levels are applied than normal functional operation – sometimes causing the device to fail. This ‘false failure’ c... » read more

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tag: yield

IC Yield Issues

Experts At The Table: Yield Issues

Experts At The Table: Yield Issues

Experts At The Table: Yield Issues

Rethinking Test