category: Test, Measurement and Analytics

category: IoT, Security & Automotive

DRAM Test And Inspection Just Gets Tougher
By Anne Meixner - 07 Nov, 2023 - Comments: 0

DRAM manufacturers continue to demand cost-effective solutions for screening and process improvement amid growing concerns over defects and process variability, but meeting that demand is becoming much more difficult with the rollout of faster interfaces and multi-chip packages. DRAM plays a key role in a wide variety of electronic devices, from phones and PCs to ECUs in cars and servers ins... » read more

Rebalancing Test And Yield In IC Manufacturing
By Gregory Haley - 07 Nov, 2023 - Comments: 0

Balancing yield and test is essential to semiconductor manufacturing, but it's becoming harder to determine how much weight to give one versus the other as chips become more specialized for different applications. Yield focuses on maximizing the number of functional chips from a production batch, while test aims to ensure that each chip meets rigorous quality and performance standards. And w... » read more

Addressing Trench Structures And Larger Wafers For Power Devices
By Vamsi Velidandla - 07 Nov, 2023 - Comments: 0

Wind power. Rail. Solar energy. And, perhaps most significantly, electric and hybrid vehicles. Together, these four forces are among the major demand drivers for power devices. While silicon (Si) still plays a role in power devices, wide-bandgap compound semiconductors like silicon carbide (SiC) and gallium nitride (GaN) are particularly well-suited for power devices thanks to their higher e... » read more

Connection Perfection
By Ramsay Allen - 07 Nov, 2023 - Comments: 0

Whether you are a DFT engineer or a SoC designer, connectivity validation will no doubt be a top priority when taking steps to guarantee the functionality and reliability of your device. SoC designs continue to grow in both size and complexity to meet the ever-growing performance and power demands associated with modern technology. To keep up with this fast-paced evolution, the corresponding D... » read more

Ensuring A Connected World With FiRA-Certified Solutions
By Alejandro Escobar Calderon - 07 Nov, 2023 - Comments: 0

In our rapidly evolving technological landscape, wireless standards play a pivotal role in ensuring the seamless operation of various wireless devices and networks. As the demand for reliable and high-performance wireless technologies continues to grow, the role of test vendors in certifying compliance with these standards becomes increasingly important. Wireless standards serve as the found... » read more

The Power Of AI To Drive Productivity Gains
By Regan Mills - 07 Nov, 2023 - Comments: 0

Tuberculosis (TB) has been around for at least 9000 years, and people have been trying to find a cure or treatment for hundreds of years, but it remains one of the deadliest infectious diseases in the world, killing more than 1.5 million people per year. Despite all of the motivation and effort, there has been only partial progress in fully eradicating the disease but a company in South Korea, ... » read more

Tiny Dots, Big Impact: The Luminous World of Quantum Dots
By Xia Stammer - 07 Nov, 2023 - Comments: 0

In the early ’80s, Alexey Ekimov and Louis E. Brus independently researched semiconductor clusters, leading to the discovery of quantum dots (QDs). QDs are nanoscale semiconductor particles with unique optical and electronic properties. In 1993, Moungi Bawendi improved quantum dot production, making them nearly perfect for various applications. By the late ’90s and early 2000s, quantum d... » read more

Automated Constraint Management For Faster Designer Productivity
By Synopsys - 07 Nov, 2023 - Comments: 0

Constraints management helps shorten the designer’s manual constraints transformation effort across the design cycle with automated constraints management flows. The management of constraints refers to tasks that are not associated with verifying the correctness of constraints, nor associated with the generation of constraints, but with the transformation of constraints from one form to anoth... » read more

X-ray And Acoustic Inspection
By Nordson Test And Inspection - 07 Nov, 2023 - Comments: 0

X-ray and acoustic imaging are two very complimentary tools for non destructively inspecting the quality of electronics components. Both techniques give information on different aspects of component integrity. Click here to read more of this application note from Nordson's Test and Inspection division.   » read more

Isolating Critical Data In Failure Analysis
By Anne Meixner - 01 Nov, 2023 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss traceability and the lack of data needed to perform root cause analysis with Frank Chen, director of applications and product management at Bruker Nano Surfaces & Metrology; Mike McIntyre, director of product management in the Enterprise Business Unit at Onto Innovation; Kamran Hakim, ASIC reliability engineer at Teradyne... » read more

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