A Guide To FT‑NIR Spectroscopy In The Chemical Lab


Quality control in the chemical and petrochemical industry is a complex task. Often the many different parameters need to be analyzed using a wide variety of instruments and complex workflows. Timing is also very important — the production team needs results within minutes, not hours. FT-NIR can help you simplify analysis routines in the lab. Often, many different parameters can be analyzed w... » read more

Smart DFT Infrastructure And Automation Are Key To Managing Design Scaling


This paper describes how using a smarter DFT infrastructure and automation can greatly improve the DFT schedule. A structural DFT infrastructure based on plug-and-play principles is used to enable concurrent DFT development and integration. DFT automation is used to connect and manage the DFT infrastructure to dramatically reduce the risks associated with design scaling and complexity. Highe... » read more

Unknowns Driving Up The Cost Of Auto IC Reliability


Automotive chipmakers are considering a variety of options to improve the reliability of ICs used for everything from sensors to artificial intelligence. But collectively they could boost the number of process steps, increase the time spent in manufacturing and packaging, and stir up concerns about the amount of data that needs to be collected, shared, and stored. Accounting for advanced pro... » read more

What Causes Semiconductor Aging?


Semiconductor technology has evolved to the point where no one can assume chips will last forever. If not carefully considered, aging can shorten the life of an IC below the needs for an intended application. Aging is well studied in technology circles, but while others less directly involved may understand at a general level this is a problem, it's not always obvious why. So what exactly ar... » read more

Critical Moves: Advanced Logic Devices And CIS Benefit From Applications Using IRCD Metrology


As 3D NAND continues to scale vertically — all in the name of increasing capacity and speed and reducing inefficiency and cost — maintaining channel hole critical dimension (CD) and shape uniformity becomes even more challenging. Faced with rising high-aspect ratios, addressing these challenges requires new inline non-destructive metrology to provide real-time process control. Infrared crit... » read more

Simplify DFT For Advanced SoCs


The purpose of electronic design automation (EDA) software is to solve SoC design problems and simplify the entire process. For design for test (DFT), this means aiming to streamline the DFT development for today’s large and complex designs. The technologies and methods developed through partnerships between EDA suppliers, foundries, and semiconductor companies should effectively reduce risk,... » read more

More Manufacturing Issues, More Testing


Douglas Lefever, CEO of Advantest America, sat down with Semiconductor Engineering to talk about changes in test, the impact of advanced packaging, and business changes that are happening across the flow. What follows are excerpts of that discussion. SE: What are the big changes ahead in test? Lefever: It's less about inflection points and more like moving from algebra to calculus in the ... » read more

Evolution Of Data Center Networking Technology — IP And Beyond


Ethernet is ubiquitous—it is the core technology that defines the Internet and serves to connect the world in ways that people could not imagine even one generation ago. HPC clusters are working on solving the most challenging problems facing humanity—and cloud computing is the service hosting many of the application workloads struggling with these questions. While alternative network infra... » read more

Is A Guestimate Good Enough For Obtaining Failure Mode Distribution?


SoCs targeting automotive applications are required to meet certain safety and quality standards as described in ISO 26262. A quantitative approach to safety analysis involves performing Failure Mode Effects and Diagnostic Analysis (FMEDA). FMEDA is a systematic quantitative analysis technique to obtain subsystem/product level failure rates, failure modes and diagnostic capabilities of systemat... » read more

The Gargantuan 5G Chip Challenge


Blazing fast upload and download speeds for cellular data are coming, but making the technology function as expected throughout its expected lifetime is an enormous challenge that will require substantial changes across the entire chip ecosystem. While sub-6GHz is an evolutionary step from 4G LTE, the real promise of 5G kicks in with millimeter-wave (mmWave) technology. But these higher-freq... » read more

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