A new technical paper titled “FMEDA based Fault Injection to Validate Safety Architecture of SPI” was published by researchers at R.V. College of Engineering in India and Analog Devices.
Abstract
“The integration of advanced technologies into Electrical Vehicles (EV) has been increasing in recent times, so it has become crucial to evaluate the risk of the technologies that are deployed into it. Functional safety is something which is required in automobiles for ensuring safety of human lives. Battery Management System (BMS) chip is one such important component of EV which uses Serial Peripheral Interface (SPI) as a peripheral to communicate with external ICs to monitor battery state used in an EV. To get this chip functional safety certification, every block in on the chip should possess safety architecture around it and functional safety verification for the same should be done. This paper performs Failure Mode Effects and Diagnostic Analysis (FMEDA) based Fault Injection to validate the safety architecture of SPI as recommended by ISO 26262. Diagnostic coverage of 97.2 % is achieved for the single point faults in the SPI block which makes it sufficient to achieve Single Point Fault Metric (SPFM) of 99% for the entire chip.”
Find the open access technical paper here. Published July 2022.
Citation: Vinod Sai E , Praneeth Uddagiri , Namita Palecha, 2022, FMEDA based Fault Injection to Validate Safety Architecture of SPI, INTERNATIONAL JOURNAL OF ENGINEERING RESEARCH & TECHNOLOGY (IJERT) Volume 11, Issue 07 (July 2022). Attribution 4.0 International (CC BY 4.0).
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