What causes expected values in a scan test to change?
Jayant D’Souza, product manager at Mentor, a Siemens Business, explains the difference between scan test and scan diagnosis, what causes values in a scan test to change, how this can be used to hone in on the actual cause of a failure in a design, and how to utilize test hardware more efficiently.
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Can we use the word “Design” in scan diagnosis? Each manufactured chip is different. Every chip that fails may fail differently? Are we diagnosing the chip for functional bugs or manufacturing defects …?