How to prevent defects that can cause errors.
Defects can creep into chip manufacturing from anywhere, but the problem is getting worse at advanced nodes and in advanced packages where reduced pin access can make testing much more difficult. Ira Leventhal, vice president of U.S. Applied Research and Technology at Advantest America, talks about what’s causing these so-called silent data errors, how to find them, and why it now requires machine learning and the sharing of data across multiple process steps to be able to identify potential problems.
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Why Silent Data Errors Are So Hard To Find
Subtle IC defects in data center CPUs result in computation errors.
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