tag: DFT

Accelerating Test Pattern Bring-Up For Rapid First Silicon Debug
By Mentor, a Siemens Business - 22 Aug, 2018 - Comments: 0

Reducing the time spent on silicon bring-up is critical in getting ICs into the hands of customers and staying competitive. Typically, the silicon bring-up process involves converting the test patterns to a tester-specific format and generating a test program that is executed by Automatic Test Equipment (ATE). This standard silicon bring-up flow is becoming too slow and expensive, especially fo... » read more

Changing The Design Flow
By Ed Sperling - 07 Aug, 2018 - Comments: 0

Synopsys’ Michael Jackson talks with Semiconductor Engineering about why it’s becoming necessary to fuse together various pieces of digital design. https://youtu.be/AOWh4wjw-ps » read more

Accelerating Test Pattern Bring-Up For Rapid First Silicon Debug
By Mentor, a Siemens Business - 12 Jul, 2018 - Comments: 0

Reducing the time spent on silicon bring-up is critical in getting ICs into the hands of customers and staying competitive. Typically, the silicon bring-up process involves converting the test patterns to a tester-specific format and generating a test program that is executed by Automatic Test Equipment (ATE). This standard silicon bring-up flow is becoming too slow and expensive, especially fo... » read more

Putting “Design” Back Into Design For Test In PCB Products
By Mentor, a Siemens Business - 11 Jun, 2018 - Comments: 0

Design for manufacturing (DFM) has become a proactive part of the design process, but the same cannot be said for DFT. Whereas “left-shifting” DFM has reduced manufacturing problems, increased yield, reduced scrap levels, and simplified engineering rework, testability-related improvements have stayed flat during that same time. Unfortunately, as assembly costs have come down, and test-relat... » read more

Looking At Test Differently
By Ed Sperling - 05 Mar, 2018 - Comments: 1

Wilhelm Radermacher, executive advisor at [getentity id="22816" e_name="Advantest"], sat down with Semiconductor Engineering to discuss how the impact of rapid market changes, advanced packaging approaches and increasing complexity on test strategies and equipment. What follows are excerpts of that conversation. SE: As we move into new markets where use models and stresses on devices are dif... » read more

A Simple Way To Improve Automotive In-System Test
By Jeff Mayer - 11 Jan, 2018 - Comments: 0

The remarkable growth in automotive IC design has prompted a focus on ISO26262 functional safety compliance, which includes both high-quality manufacturing test and a minimum stuck-at test coverage of 90% for in-system test. Designers must also control IC test data volumes, test application times, and test costs. A new test point technology that improves in-system test coverage and reduces patt... » read more

Tessent MissionMode: New Inline DFT Technology
By Mentor Graphics Staff Writers - 08 Jan, 2018 - Comments: 0

Written for automotive OEMs and suppliers, this whitepaper gives an overview of design-for-test (DFT) technology. Among the topics addressed: Why is DFT important in IC design generally and critical for creating automotive ICs in particular? And how does the new Tessent MissionMode technology, teamed with some of Mentor’s other DFT offerings, pave the way for the automotive industry to develo... » read more

Smarter DFT Infrastructure And Automation Emerge As Keys To Managing DFT Design Scaling
By Ron Press - 21 Dec, 2017 - Comments: 0

By Ron Press and Vidya Neerkundar The reality of DFT for large and complex SoCs has introduced new risk into design schedules. DFT teams end up in the critical path to tape out while waiting for portions of the design to be complete, and there are more DFT integration steps than ever before. The traditional approaches to DFT work on huge designs pose problems of repeatability and reliability... » read more

Changes Ahead For Test
By Jeff Dorsch - 11 Dec, 2017 - Comments: 0

Testing microprocessors is becoming more difficult and more time consuming as these devices are designed to take on more complex tasks, such as accelerating artificial intelligence computing, enabling automated driving, and supporting deep neural networks. This is not just limited to microprocessors, either. Graphics processing units are grabbing market share in supercomputing and other area... » read more

Effective Management Of System Designs
By Ranjit Adhikary - 08 Nov, 2017 - Comments: 0

With the advent of the Internet-of-Things (IoT), system designs are slowly but surely becoming more complex. They now use heterogeneous architectures both on the System-on-Chip (SoC) and within a package. These systems typically have multiple different CPU cores, hardware accelerators, memories, network-on-chip (NoC) fabrics and numerous peripheral interfaces. Now, add to this the complexiti... » read more

← Older posts Newer posts →

  • Sponsors

About

Navigation

Connect With Us

Copyright ©2013-2024 SMG   |  Terms of Service  |  Privacy Policy