Learn about unified compression, a new approach that unifies scan compression and logic built-in self-test (LBIST).
Unified compression is a new approach that unifies scan compression and logic built-in self-test (LBIST). It leverages recent innovations from Cadence in physically-aware design for test (DFT) to solve routing congestion and area issues from traditional discrete approaches and delivers a confident path to high-quality test. On a sample design, area savings of 35–47%, and scan wirelength savings of 63–77% for the same channel length can be demonstrated. Also, with the same area and scan wirelength budget, the channel length could instead be reduced by half to reduce the overall test time with the same fault coverage.
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