Researchers at the University at Buffalo, University of Stuttgart, and IBM Research published “SI-GT: Fast Interconnect Signal Integrity Analysis For Integrated Circuit Design Via Graph Transformers.”
Abstract Excerpt: “In this paper, we propose Si-GT, a novel transformer-based model for fast and accurate signal integrity analysis in IC interconnects.”
Find the technical paper here. April 2026.
Hu, Yuting, Tarek Mohamed, Chenhui Xu, Hua Xiang, Hussam Amrouch, Gi-Joon Nam, and Jinjun Xiong. “Si-GT: Fast Interconnect Signal Integrity Analysis for Integrated Circuit Design via Graph Transformers.” Paper presented at the International Conference on Learning Representations, April 2026.
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