tag: analog

40 GHz VCO and Frequency Divider in 28 nm FD-SOI CMOS Technology for Automotive Radar Sensors
By Technical Paper Link - 31 Aug, 2021 - Comments: 0

Abstract: "This paper presents a 40 GHz voltage-controlled oscillator (VCO) and frequency divider chain fabricated in STMicroelectronics 28 nm ultrathin body and box (UTBB) fully depleted silicon-on-insulator (FD-SOI) complementary metal-oxide–semiconductor (CMOS) process with eight metal layers back-end-of-line (BEOL) option. VCOs architecture is based on an LC-tank with p-type metal-oxide�... » read more

The Evolving Landscape Of SoC Vulnerabilities And Analog Threats
By Siemens EDA - 04 Aug, 2021 - Comments: 0

SoC integrators know that a software-only chip security plan leaves devices open to attack. The more effective way to thwart hackers is to combat both digital and analog threats by incorporating security-focused hardware modules built into the core machine design. This paper describes sources of vulnerabilities to cyber attacks and what infrastructure is needed to secure against them. The So... » read more

ASIC/IC Verification Trends With A Focus On Factors Of Silicon Success
By Harry Foster - 08 Jul, 2021 - Comments: 0

At long last we come to the final installment of our four-part series presenting the findings of the Wilson Research Group Functional Verification 2020 study. In this article we discuss verification trends in IC/ASIC language and library adoption, low power management, and verification effectiveness. We then take a deeper dive into two somewhat surprising phenomena revealed in the data: the ... » read more

‘Hug The Debug’ – Before It’s Too Late
By Sumit Vishwakarma - 01 Jul, 2021 - Comments: 0

Though the term “shift-left” originated in the software industry, its importance is often cited in the hardware (semiconductor) industry where the end-product (chip) costs are skyrocketing. The increase in cost is driven by a global chip shortage, especially in the automotive industry. Manufacturing a robust chip is a long, iterative process that may require many re-spins. Shift-left refers... » read more

High Thermal Die-Attach Paste Development For Analog Circuits
By Amkor - 16 Jun, 2021 - Comments: 0

In recent years, various die attach (DA) materials have been developed to cope with the higher power dissipation requirements of semiconductor devices. DA materials based on metals such as solder or sintered silver (Ag) are used for very high heat generating power devices. While they show outstanding thermal performance, the mechanical properties of these materials are less than ideal. This lim... » read more

Monitoring Performance From Inside A Chip
By Ed Sperling - 01 Jun, 2021 - Comments: 0

Deep data, which is generated inside the chip rather than externally, is becoming more critical at each new process node and in advanced packages. Uzi Baruch, chief strategy officer at proteanTecs, talks with Semiconductor Engineering about using that data to identify potential problems before they result in failures in the field, and why it's essential to monitor these devices throughout their... » read more

Virtuoso ADE Assembler
By Cadence - 26 May, 2021 - Comments: 0

Cadence Virtuoso ADE Assembler is an advanced design and simulation environment that extends the capabilities of Virtuoso ADE Explorer, adding all the tests needed to fully verify a design over all operational, process, and environmental conditions. As more analysis is required, users can take incremental advantage of the Virtuoso Variation Option to do more advanced statistical analysis on the... » read more

Next-Gen SerDes Roadmap
By Ed Sperling - 25 May, 2021 - Comments: 0

An explosion in data is causing a series of successive bottlenecks in the data center. Priyank Shukla, product marketing manager for high-speed SerDes IP at Synopsys, digs into the performance roadmap for moving data within server racks and between different racks, where the bottlenecks are today, and how they will be addressed in the future. Related SerDes Knowledge Center Top stories... » read more

Testing Analog Circuits Becoming More Difficult
By SE Staff - 11 May, 2021 - Comments: 1

Foundries and packaging houses are wrestling how to control heat in the testing phase, particularly as devices continue to shrink and as thermally sensitive analog circuits are added into SoCs and advanced packages to support everything from RF to AI. The overriding problem is that heat can damage chips or devices under test. That's certainly true for digital chips developed at advanced node... » read more

Chasing Test Escapes In IC Manufacturing
By Anne Meixner - 11 May, 2021 - Comments: 0

The number of bad chips that slip through testing and end up in the field can be significantly reduced before those devices ever leave the fab, but the cost of developing the necessary tests and analyzing the data has sharply limited adoption. Determining an acceptable test escape metric for an IC is essential to improving the yield-to-quality ratio in chip manufacturing, but what exactly is... » read more

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