Next Steps For Improving Yield


Chipmakers are ramping new tools and methodologies to achieve sufficient yield faster, despite smaller device dimensions, a growing number of systematic defects, immense data volumes, and massive competitive pressure. Whether a 3nm process is ramping, or a 28nm process is being tuned, the focus is on reducing defectivity. The challenge is to rapidly identify indicators that can improve yield... » read more

Automotive Applications Demand Silicon Lifecycle Management


Every electrical engineer learns early in university studies that automobiles are a highly demanding environment for electronics. Temperature and humidity extremes, noise and vibration, electrical interference, exposure to alpha particles, and other factors all make it hard to design and manufacture chips that will operate properly under all conditions. These challenges are exacerbated as chips... » read more

Are We Too Hard On Artificial Intelligence For Autonomous Driving?


I recently attended and presented at Detroit's "Implementation of ISO 26262 & SOTIF" conference. Its subtitle was "Taking an Integrated Approach to Automotive Safety." After three days, my head was spinning with numbers of ISO/SAE and other standards. And at the end of day two, after yet another example that tricked autonomous driving prototypes into behaving wrongly, I sighed and asked whe... » read more

How Digital Twins Are Unlocking The Next Era Of Aerospace And Government Applications


By Ian Land, Jason Niatas, and Marc Serughetti Amidst changing economic waters and stringent manufacturing cycles, the aerospace, defense, and government landscape has seen an impressive technological evolution in the last few years. Innovations such as automating mission-critical systems and deploying advanced electronics in deep space exploration are expanding opportunities for government ... » read more

Technical and Structural Approaches To Centralize Automotive E/E Architectures


A technical paper titled "Methodical Approach for Centralization Evaluation of Modern Automotive E/E Architectures" was published by researchers at University of Stuttgart and Daimler Truck AG. Abstract: "Centralization is considered as a key enabler to master the CPU-intensive features of the modern car. The development and architecture change towards the next generation car is influenced ... » read more

E-Mobility: Navigate Safety, Interoperability, And Conformance


Although the concept of electric vehicles (EV) has been around for a while, the EV and EV supply equipment (EVSE) markets are not well-regulated or fully operational. This presents several challenges for EV and EVSE manufacturers throughout the e-mobility ecosystem. Safety, interoperability, and conformance are important criteria for enabling e-mobility, and Keysight is ready to help. Read this... » read more

Hardware Trojan Inserted Inside A RISC-V Based Automotive Telematics Control Unit


A new technical paper titled "On the Feasibility of Remotely Triggered Automotive Hardware Trojans" was written by researchers at Georgia Tech. "In this paper, we discuss how Hardware Trojans can act as the physical access intermediates to allow the remote triggering of malicious payloads embedded in ECUs, through seemingly benign wireless communication. We demonstrate a proof of concept ECU... » read more

EVs Raise Energy, Power, And Thermal IC Design Challenges


The transition to electric vehicles is putting pressure on power grids to produce more energy and on vehicles to use that energy much more efficiently, creating a gargantuan set of challenges that will affect every segment of the automotive world, the infrastructure that supports it, and the chips that are required to make all of this work. From a semiconductor standpoint, improvements in th... » read more

The Automotive Paradigm Shift


We are currently experiencing a pivotal moment concerning the automotive industry. Three major technology areas are converging. First, there is an enormous demand for advanced driver-assistance systems (ADAS) coupled with the increasing trend toward autonomy. Second is the digitization and electrification of everything, which is driving the need for efficient compute. Third is the trend to high... » read more

Similar But Different — The Tale Of Transient And Permanent Faults


When determining whether an IC is safe from random hardware faults, applying safety metrics such as PMHF, SPFM, and LFM, engineers must analyze both transient and permanent faults. This paper highlights the fundamental differences between permanent and transient faults on digital circuits, and why this distinction is important in the context of the ISO 26262:2018 functional safety standard. ... » read more

← Older posts Newer posts →