tag: ESD protection

Mastering 3D-IC Verification Complexity
By Matt Grange - 11 Jun, 2026 - Comments: 0

The semiconductor industry's transition from traditional 2D integrated circuits to 2.5D and 3D-IC configurations represents more than an incremental advancement. This architectural shift, driven by the need to push beyond conventional scaling limitations, introduces a cascade of verification challenges that legacy methodologies struggle to address. As designs incorporate multiple stacked dies, ... » read more

Rethinking ESD Protection for System-On-Integrated Chiplets (UC Riverside)
By Technical Paper Link - 28 Apr, 2026 - Comments: 0

A new technical paper, "In-SoIC ESD Protection for Chiplet-Based 3D Microsystems: Future Research Directions," was published by researchers at the University of California, Riverside. Abstract "Heterogeneous integration opens a pathway to three-dimensional chiplet-based microsystem chips. Electrostatic discharge reliability is a major challenge to future smart chips featuring rich functio... » read more

Calibre 3DPERC: Your Key To Robust ESD Solutions For 3D ICs
By Siemens EDA - 03 Dec, 2025 - Comments: 0

As semiconductor designs move beyond the limits of planar integration, three-dimensional (3D) IC technology introduces new challenges for ESD (electrostatic discharge) protection and verification. In this paper, author Dina Medhat explores how traditional verification methods must evolve for 3D ICs, detailing the crucial differences in pad classification, protection circuit strategies and the i... » read more

Simplifying ESD Protection and Inter-Chiplet Signaling In Future 2.5D/3D Packaging Technologies (Arizona State, Univ. of Minnesota)
By Technical Paper Link - 25 Nov, 2025 - Comments: 0

A new technical paper titled "Tiny Chiplets Enabled by Packaging Scaling: Opportunities in ESD Protection and Signal Integrity" was published by researchers at Arizona State University and University of Minnesota. Abstract: "The scaling of advanced packaging technologies provides abundant interconnection resources for 2.5D/3D heterogeneous integration (HI), thereby enabling the construction... » read more

Pre-Silicon Verification Of Die-to-Die IP With Novel ESD Protection
By Synopsys - 26 Feb, 2025 - Comments: 0

All major foundries have adopted the programmable electrical rule checker (PERC) as the pre-silicon electrostatic discharge (ESD) signoff tool for IP and chip designs. This concept of rule checking works fine for most IP types, but for die-to-die IP, used in 3DIC designs, the PERC approach may not be appropriate. Die-to-die interface IP includes extremely large numbers of I/Os, trending towards... » read more

ESD Co-Design For 224G And 112G SerDes In FinFET Technologies
By Synopsys - 25 Oct, 2023 - Comments: 0

In addressing the challenges of enhancing ESD resilience for high-speed SerDes interfaces, it's crucial to ensure the implementation of appropriate ESD protection measures. This is particularly vital during the device's lifecycle from the conclusion of silicon wafer processing to system assembly, a phase during which electronic devices are highly susceptible to Electrostatic Discharge (ESD) dam... » read more

ESD Co-Design For High-Speed SerDeS In FinFET Technologies
By Synopsys - 07 Jun, 2023 - Comments: 0

An electronic device is susceptible to Electrostatic Discharge (ESD) damage during its entire life cycle, including the phase from the completion of the silicon wafer processing to when the device (die) is assembled in the system. To avoid yield loss due to ESD damage during this early phase, on-chip ESD protection measures are applied to provide a certain degree of ESD robustness. The componen... » read more

Ensuring ESD Protection Verification With Industry-Standard Checks
By Mark Tawfik - 21 Dec, 2022 - Comments: 0

Electronic design automation (EDA) verification of electrostatic discharge (ESD) protection is a complex task. Different integrated circuit (IC) design companies use different ESD protection approaches, different design flows, and different verification tools. To establish a consistent and comprehensive ESD EDA verification flow, the ESD Association (ESDA) provides recommended ESD compliance ch... » read more

Are You Paying Proper Attention To Your ESD Design Windows?
By Derong Yan - 10 Nov, 2022 - Comments: 0

Electrostatic discharge (ESD) issues in integrated circuit (IC) chip designs have become more critical at advanced semiconductor process nodes, due to shrinking transistor dimensions and oxide layer thickness [1]. There are many ESD design rules and flows that designers check for common ESD issues, such as topological checks for the existence of ESD protection devices, current density (CD) chec... » read more

2.5/3D IC Reliability Verification Has Come A Long Way
By Dina Medhat - 01 Aug, 2022 - Comments: 0

2.5D/3D integrated circuits (ICs) have evolved into an innovative solution for many IC design and integration challenges. As shown in figure 1, 2.5D ICs have multiple dies placed side-by-side on a passive silicon interposer. The interposer is placed on a ball grid array (BGA) organic substrate. Micro-bumps attach each die to the interposer, and flip-chip (C4) bumps attach the interposer to the ... » read more

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