Technical Paper Round-Up: July 5


New technical papers added to Semiconductor Engineering’s library this week. [table id=36 /] Semiconductor Engineering is in the process of building this library of research papers. Please send suggestions (via comments section below) for what else you’d like us to incorporate. If you have research papers you are trying to promote, we will review them to see if they are a good fit for... » read more

MEMprop: Gradient-based Learning To Train Fully Memristive SNNs


New technical paper titled "Gradient-based Neuromorphic Learning on Dynamical RRAM Arrays" from IEEE researchers. Abstract "We present MEMprop, the adoption of gradient-based learning to train fully memristive spiking neural networks (MSNNs). Our approach harnesses intrinsic device dynamics to trigger naturally arising voltage spikes. These spikes emitted by memristive dynamics are anal... » read more

Quantum Computers And CMOS Semiconductors: A Review And Future Predictions


With the advent of quantum computing, the need for peripheral fault-tolerant logic control circuitry has reached new heights. In classical computation, the unit of information is a “1” or “0”. In quantum computers, the unit of information is a qubit which can be characterized as a “0”, “1”, or a superposition of both values (known as a “superimposed state”). The control c... » read more

Can Analog Make A Comeback?


We live in an analog world dominated by digital processing, but that could change. Domain specificity, and the desire for greater levels of optimization, may provide analog compute with some significant advantages — and the possibility of a comeback. For the last four decades, the advantages of digital scaling and flexibility have pushed the dividing line between analog and digital closer ... » read more

New Challenges For Connected Vehicles


Connected vehicles are all about convenience and safety. Modern vehicles are connected to the Internet via wireless networks, consumer apps, and infotainment systems, and there is work underway to connect them over 5G to guided driving. But there also are challenges to making all of this work securely, safely, and as expected throughout the expected lifetimes of chips and systems. The goal i... » read more

Auto Chipmakers Dig Down To 10ppb


How do engineers deliver 10 defective parts per billion (Dppb) to auto makers if they only screen 1 million parts per year? Answer: By comprehending failure mechanisms and proactively screening for them. Modern automobiles contain nearly 1,000 ICs that must perform over the vehicle’s life (15 years). This drives quality expectations ever higher. While 10 Dppm used to be a solid benchmark, ... » read more

Power Grids Under Attack


Cyberattacks are becoming as troublesome to the electrical power grid as natural disasters, and the problem is growing worse as these grids become more connected and smarter. Unlike in the past, when a power outage affected just the electricity supplied to homes and businesses, power grids are becoming core elements of smart cities, infrastructure, and safety-related services. Without power,... » read more

Manufacturing Bits: Dec. 14


3D-SOCs At this week’s IEEE International Electron Devices Meeting (IEDM), a plethora of companies, R&D organizations and universities presented papers on the latest and greatest technologies. One of the themes at IEDM is advanced packaging, a technology enables an IC vendor to boost the performance of a chip. Advanced forms of packaging also enables new 3D-like chip architectures. Fo... » read more

Zonal Architectures Play Key Role In Vehicle Security


The automotive ecosystem is starting to shift toward zonal architectures, making vehicle functionality less dependent on the underlying hardware and allowing more flexibility in what gets processed where. The impact of that shift is both broad and significant. For carmakers, it could lead to hardware consolidation and more options for failovers in case something goes wrong with any system in... » read more

Manufacturing Bits: Oct. 26


GaN finFETs, scaling GaN At the upcoming IEEE International Electron Devices Meeting (IEDM) in San Francisco, a slew of entities will present papers on the latest technologies in R&D. The event, to be held Dec. 11–15, involve papers on advanced packaging, CMOS image sensors, interconnects, transistors, power devices and other technologies. At IEDM, Intel will present a paper on a GaN-... » read more

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