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SoC Verification From Pre-Fabrication To The Over-the-Air Update


The recent new of attacks on system infrastructures serves to highlight that hardware vulnerabilities in the supply chain are not only possible but inevitable if proper precautions are ignored. Verification throughout the entire supply chain is necessary to ensure the safety and security of hardware. Starting as early as the pre-fabrication stage, vulnerabilities, if left unchecked, can be an o... » read more

Hybrid System-Level Test For RF SiP


In recent years, the proliferation of the IoT has focused attention on low-power-wireless applications. IoT modules incorporating functions such as Bluetooth Low Energy (BLE) transceivers, MCUs, and power-management circuitry are becoming system-in-package (SiP) and even one-chip devices. Such devices increase the demand for a mass-production test environment that can measure them in a short ti... » read more

The Good And Bad Of Auto IC Updates


Keeping automobiles updated enough to avoid problems is becoming increasingly difficult as more complex electronics are added into vehicles, and as the lifetimes of those devices are extended to a decade or more. Modern vehicles are full of electronics. In fact, the value of electronic devices used in modern vehicles is expected to double in the next 10 years, growing to $469 billion by 2030... » read more

Testing AiP Modules In High-Volume Production


Far-field and radiating near-field are two options for high-volume over-the-air (OTA) testing of antenna-in-package (AiP) modules with automated test equipment (ATE) [1]. In this article, we define an AiP device under test (DUT) and examine the measurement results from both methods. Creating an AiP evaluation vehicle Proper evaluation of an ATE OTA measurement setup requires an AiP module. Us... » read more

Merging Verification And Test


While the disciplines of functional verification and test serve different purposes, their histories were once closely intertwined. Recent safety and security monitoring requirements coupled with capabilities being embedded into devices is bringing them closer together again, but can they successfully cooperate to bring about improvements in both? Getting there may be difficult. Three phases ... » read more

Car Industry Changing Under The Hood


After an initial burst of autonomous activity, the automotive ecosystem regrouped, re-evaluated its goals, and is now ready to begin deploying new technologies made possible by modern development approaches and forward-looking vehicle architectures. The pandemic hurt vehicle sales in 2020, but it also gave the OEMs a chance to catch their breath. Panic over announcements from other carmakers... » read more

New Test Methods For 5G Wafer High-Volume Production


In order to provide the chips required for this change in the landscape, there will be a large number of changing requirements in wafer test that come out of these architectural requirements. Form Factor partnered with Intel to investigate these changes, and tested one such example of a new test methodology. In a joint collaboration with Intel to develop a test methodology for their 5G RF-So... » read more

Secure Silicon Lifecycle Management Architecture For Functional Safety


The rapid growth of electronics for automotive applications fueled by advanced ADAS systems pose new challenges for complex SoC design and Silicon Lifecycle Management (SLM) in the supply chain as well as in-field monitoring and management of the population of chips. In these modern complex devices, ensuring the correct and safe operation requires not only functional safety to check for reli... » read more

Software-Defined Vehicles


Automobiles long ago stopped being purely mechanical systems. But as more components are electrified — and, in particular, as the drivetrain is electrified — cars are becoming software-defined vehicles. Some think of such cars as computers on wheels. But as these systems continue to evolve, adding in more assisted and semi-autonomous capabilities, that comparison is looking increasingly ... » read more

Why Safety-Critical Verification Is So Difficult


The inclusion of AI chips in automotive and increasingly in avionics has put a spotlight on advanced-node designs that can meet all of the ASIL-D requirements for temperature and stress. How should designers approach this task, particularly when these devices need to last longer than the applications? Semiconductor Engineering sat down to discuss these issues with Kurt Shuler, vice president of... » read more

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