tag: reliability

Testing AI Systems
By Ed Sperling - 15 Jan, 2019 - Comments: 0

AI is booming. It's coming to a device near you—maybe even inside of you. And AI will be used to design, manufacture and even ship those devices, regardless of what they are, where they are used, or how they are transported. The big questions now are whether these systems work, for how long—and what do those metrics even mean? An AI system, or AI-enhanced system, is supposed to adapt ove... » read more

Chasing Reliability In Automotive Electronics
By Susan Rambo And Ed Sperling - 15 Jan, 2019 - Comments: 0

Assuring reliability in automotive electronics has set off a scramble across the semiconductor supply chain and unearthed a list of issues for which there is insufficient data, a lack of well-defined standards, and inconsistent levels of expertise. Reliable functional safety that spans 18 to 20 years of service in harsh environments, or under constant use with autonomous taxis or trucks, is ... » read more

A Longer Life For LED Power Electronics
By DELTA, a part of FORCE Technology - 10 Dec, 2018 - Comments: 0

One of the greater challenges with LED lighting is the electronic driver’s robustness to normally occurring transients or power surges in the network. Many everyday examples have shown that the active electronics in the light sources find it hard to handle the effects in a use environment, in which incandescent bulbs and lamps with passive electronics have functioned fine for decades. A new p... » read more

Making Sure A Heterogeneous Design Will Work
By Ed Sperling - 03 Dec, 2018 - Comments: 0

An explosion of various types of processors and localized memories on a chip or in a package is making it much more difficult to verify and test these devices, and to sign off with confidence. In addition to timing and clock domain crossing issues, which are becoming much more difficult to deal with in complex chips, some of the new devices are including AI, machine learning or deep learning... » read more

Taming NBTI To Improve Device Reliability
By Ann Mutschler - 08 Nov, 2018 - Comments: 2

Negative-bias temperature instability is a growing issue at the most advanced process nodes, but it also has proven extremely difficult to tame using conventional approaches. That finally may be starting to change. NBTI is an aging mechanism in field-effect transistors that leads to a change of the characteristic curves of a transistor during operation. The result can be a drift toward unint... » read more

Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh Environments
By Fraunhofer IIS/EAS - 07 Nov, 2018 - Comments: 0

On the example of a 28nm SRAM array, this work presents a novel reliability study which takes into account the effect of externally applied mechanical stress in circuit simulations. This method is able to predict the bit failures caused by the stress via the piezoresistive effect. The stability of each single SRAM cell is simulated using static noise margin. Finally, the whole array’s behavio... » read more

The Impact of Domain Crossing on Safety
By Brian Bailey - 31 Oct, 2018 - Comments: 0

Semiconductor Engineering sat down to discuss problems associated with domain crossings with Alex Gnusin, design verification technologist for Aldec; Pete Hardee, director, product management for Cadence; Joe Hupcey, product manager and verification product technologist for Mentor, a Siemens Business; Sven Beyer, product manager design verification for OneSpin; and Godwin Maben, applications en... » read more

Reliability, Machine Learning And Advanced Packaging
By Ed Sperling - 11 Oct, 2018 - Comments: 0

Semiconductor Engineering sat down to discuss reliability, resilience, machine learning and advanced packaging with Rahul Goyal, vice president in the technology and manufacturing group at Intel; Rob Aitken, R&D fellow at Arm; John Lee, vice president and general manager of the semiconductor business unit at ANSYS; and Lluis Paris, director of IP portfolio marketing at TSMC. What follows ar... » read more

Why Test Costs Will Increase
By Ed Sperling - 08 Oct, 2018 - Comments: 0

The economics of test are under siege. Long seen as a necessary but rather mundane step in ensuring chip quality, or a way of testing circuitry from the inside while it is still in use, manufacturers and design teams have paid little attention to this part of the design-through-manufacturing flow. But problems have been building for some time in three separate areas, and they could have a b... » read more

Adding Safety Into Automotive Design
By Ann Mutschler - 04 Oct, 2018 - Comments: 0

The ISO 26262 spec is a household term for anyone even remotely involved with the automotive industry today. Increasingly, though, it is being used interchangeably with safety-readiness across the entire supply chain. ISO 26262 compliance is a prerequisite for IP and chips used in an increasing number of automotive applications. It applies to systems, software, and to individual products. An... » read more

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