tag: reliability

Emulation Fills The Pre-Silicon Verification Gap For Autonomous Vehicles
By Mentor, a Siemens Business - 06 Nov, 2019 - Comments: 0

Veloce emulators provide the scale and performance to ensure that automotive applications run smoothly, safely, and securely. This paper describes how emulation is used to run realistic driver scenarios, investigate vehicle dynamics, and analyze power and communications metrics — all in a platform that virtualizes the design and allows both hardware and software to be tested together or separ... » read more

Monitoring Heat On AI Chips
By Ed Sperling - 11 Oct, 2019 - Comments: 0

Stephen Crosher, CEO of Moortec, talks about monitoring temperature differences on-chip in AI chips and how to make the most of the power that can be delivered to a device and why accuracy is so critical. » read more

The Growing Impact Of Portable Stimulus
By Brian Bailey - 26 Sep, 2019 - Comments: 0

It has been a year since Accellera's Portable Test and Stimulus Specification became a standard. Semiconductor Engineering sat down to discuss the impact it has had, and the future direction of it, with Dave Kelf, chief marketing officer for Breker Verification Systems; Larry Melling, product management director for Cadence; Tom Fitzpatrick, strategic verification architect for Mentor, a Siemen... » read more

The Critical But Less Obvious Risks In AI
By Ed Sperling - 10 Sep, 2019 - Comments: 0

AI has been the subject of intense debate since it was first introduced back in the mid-1950s, but the real threat is a lot more mundane and potentially even more serious than the fear-inducing picture painted by its critics. Replacing jobs with technology has been a controversial subject for more than a century. AI is a relative newcomer in that debate. While the term "artificial intelligen... » read more

How Hardware Can Bias AI Data
By Ed Sperling - 10 Sep, 2019 - Comments: 1

Clean data is essential to good results in AI and machine learning, but data can become biased and less accurate at multiple stages in its lifetime—from moment it is generated all the way through to when it is processed—and it can happen in ways that are not always obvious and often difficult to discern. Blatant data corruption produces erroneous results that are relatively easy to ident... » read more

IP’s Growing Impact On Yield And Reliability
By Ann Mutschler - 04 Sep, 2019 - Comments: 0

Chipmakers are finding it increasingly difficult to achieve first-pass silicon with design IP sourced internally and from different IP providers, and especially with configurable IP. Utilizing poorly qualified IP and waiting for issues to appear during the design-to-verification phase just before tape-out can pose high risks for design houses and foundries alike in terms of cost and time to... » read more

Degradation Monitoring – From Vision to Reality
By Evelyn Landman - 06 Aug, 2019 - Comments: 0

Reliability physics has historically focused on models for time-to-failure, but that approach is reaching its limit. Those models generally were developed using data gathered from very simple test structures that could be stressed to failure. Today, with electronics playing a such a critical role in our everyday life, failures are no longer an option. The underlying ICs being implemented call f... » read more

Using Better Data To Shorten Test Time
By Ed Sperling - 06 Aug, 2019 - Comments: 1

The combination of machine learning plus more sensors embedded into IC manufacturing equipment is creating new possibilities for more targeted testing and faster throughput for fabs and OSATs. The goal is to improve quality and reduce the cost of manufacturing complex chips, where time spent in manufacturing is ballooning at the most advanced nodes. As the number of transistors on a die incr... » read more

Signoff-Compatible CDC
By Ed Sperling - 29 Jul, 2019 - Comments: 2

Tanveer Singh, senior staff consulting applications engineer at Synopsys, explains why netlist clock domain crossing is now an essential complement to RTL CDC, why CDC issues are worse at advanced nodes and in AI chips, and why dealing with CDC effectively is becoming a competitive requirement for performance and low power. » read more

Material Choices In Printed Temperature Sensors
By Ed Sperling - 24 Jul, 2019 - Comments: 0

Vijaya Kayastha, lead device development engineer at Brewer Science, talks about what’s needed for printed temperature sensors, what happens when there are impurities in the materials, how these sensors respond to stress, and how costs compare to traditional sensors. » read more

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