The Path To (Virtually) Zero Defective Parts Per Million

Despite thorough wafer and package testing, a small number of defective ICs can make their way into systems. These test "escapes" often return as field failures, increasing costs and eroding profit margins. They can also present a hazard if deployed in safety-critical systems, which is why companies purchasing semiconductors for automotive, medical, or aerospace applications often demand a zero... » read more

Migrating Consumer Electronics To The Automotive Market With Calibre PERC

Tough reliability standards for electronic automotive safety systems ensure that integrated circuits (ICs) for these systems comply with demanding performance and reliability requirements. However, companies seeking to leverage their consumer-based intellectual property (IP) for use in automotive “infotainment” and “connected car” applications are finding that many of these performance ... » read more

Top-down Design Of Distributed Embedded Systems In Light Of Timing Considerations

Proper safeguarding of safety-critical systems in an automotive environment cannot be ensured sufficiently without taking timing into consideration. The failure to observe timing constraints can lead to malfunctions and, in a worst-case scenario, can cause vehicle damage and personal injury. AUTOSAR 4.0 now supports timing constraints, but the standard, although very powerful, still is not able... » read more