Navigating The Intersection Of Safety And Security


Automotive IC safety and security continue to be hot topics across the industry, and one phrase you may often hear during discussion is: An automotive IC can be secure without needing to be safe, but an automotive IC cannot be safe without also being secure. Adding a bit of detail to that: An automotive IC which has an incomplete security architecture provides potential attack vectors w... » read more

Blog Review: Jan. 4


Siemens EDA's Harry Foster investigates the percentage of total IC/ASIC project time spent in verification and increasing engineering headcount, particularly growing demand for verification engineers. Synopsys' Stelios Diamantidis argues that retargeting older chips using AI offers a way to move chip designs between nodes and absorb the market’s excess capacity. Cadence's Paul McLellan ... » read more

Comprehensive S-Parameter Verification Coverage With Analog FastSPICE


IC design is transforming at an accelerated pace along with fabrication technology. The need to incorporate more functionality has led to denser dies, multi-die chips, stacked 3D ICs and advanced packaging. Furthermore, design technology continues to progress towards supporting higher data rates to address the increasing demand for more and enhanced connectivity. We now must deal with much more... » read more

Ensuring ESD Protection Verification With Industry-Standard Checks


Electronic design automation (EDA) verification of electrostatic discharge (ESD) protection is a complex task. Different integrated circuit (IC) design companies use different ESD protection approaches, different design flows, and different verification tools. To establish a consistent and comprehensive ESD EDA verification flow, the ESD Association (ESDA) provides recommended ESD compliance ch... » read more

RISC-V Pushes Into The Mainstream


RISC-V cores are beginning to show up in heterogeneous SoCs and packages, shifting from one-off standalone designs toward mainstream applications where they are used for everything from accelerators and extra processing cores to security applications. These changes are subtle but significant. They point to a growing acceptance that chips or chiplets based on an open-source instruction set ar... » read more

Speed Up Early Design Rule Exploration And Physical Verification


Ensuring that early-stage IC design physical verification actually enhances IC design and verification productivity means giving engineers the ability to focus on those errors that are both valid and critical in early-stage designs. The Calibre nmDRC Recon functionality provides selective DRC of early-stage designs that focuses on real, relevant errors, ignoring rule checks that generate meanin... » read more

Blog Review: Dec. 20


Synopsys' Twan Korthorst explains how PDKs can help accelerate the photonic IC design process by offering building blocks such as several types of waveguides, passive devices like splitters, combiners, and filters, along with active devices such as phase shifters, detectors, semiconductor optical amplifiers, and lasers. Siemens EDA's Harry Foster examines IC and ASIC design trends, including... » read more

Efficient Trace In RISC-V


Systems with RISC-V cores often include multiple types of other processors and accelerators. Peter Shields, product manager for Tessent at Siemens Digital Industries Software, talks about what's needed for debug and trace in context, including the need for unobtrusive observation at full speed, what to trace and when to trace it, and how embedded IP can identify to report which branches are tak... » read more

The March Toward Chiplets


The days of monolithic chips developed at the most advanced process nodes are rapidly dwindling. Nearly everyone working at the leading edge of design is looking toward some type of advanced packaging using discrete heterogeneous components. The challenge now is how to shift the whole chip industry into this disaggregated model. It's going to take time, effort, as well as a substantial reali... » read more

3D-IC Reliability Degrades With Increasing Temperature


The reliability of 3D-IC designs is dependent upon the ability of engineering teams to control heat, which can significantly degrade performance and accelerate circuit aging. While heat has been problematic in semiconductor design since at least 28nm, it is much more challenging to deal with inside a 3D package, where electromigration can spread to multiple chips on multiple levels. “Be... » read more

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